GS820322T-138 데이터 시트보기 (PDF) - Giga Semiconductor
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GS820322T-138 Datasheet PDF : 23 Pages
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Preliminary
GS82032T/Q-150/138/133/117/100/66
AC Test Conditions
Parameter
Conditions
Input high level
Input low level
Input slew rate
Input reference level
Output reference level
Output load
2. 3V
0.2 V
1 V/ns
1.25 V
1.25 V
Fig. 1& 2
Notes:
1. Include scope and jig capacitance.
2. Test conditions as specified with output loading as shown in Fig. 1 unless otherwise noted.
3. Output Load 2 for tLZ, tHZ, tOLZ and tOHZ.
4. Device is deselected as defined by the Truth Table.
Output Load 1
DQ
Output Load 2
2.5 V
50Ω
30pF*
DQ
225Ω
VT = 1.25 V
* Distributed Test Jig Capacitance
5pF* 225Ω
DC Electrical Characteristics
Parameter
Input Leakage Current
(except mode pins)
ZZ Input Current
Symbol
IIL
IINZZ
Mode Pin Input Current
IINM
Output Leakage Current
IOL
Output High Voltage
VOH
Output High Voltage
VOH
Output Low Voltage
VOL
Test Conditions
VIN = 0 to VDD
VDD ≥ VIN ≥ VIH
0 V ≤ VIN ≤ VIH
VDD ≥ VIN ≥ VIL
0 V ≤ VIN ≤ VIL
Output Disable,
VOUT = 0 to VDD
IOH = –4 mA, VDDQ = 2.375 V
IOH = –4 mA, VDDQ = 3.135 V
IOL = 4 mA
Min
–1 uA
–1 uA
–1 uA
–300 uA
–1 uA
–1 uA
1.7 V
2.4 V
Max
1 uA
1 uA
300 uA
1 uA
1 uA
1 uA
0.4 V
Rev: 1.04 2/2001
11/23
© 2000, Giga Semiconductor, Inc.
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
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