P4C168L 데이터 시트보기 (PDF) - Semiconductor Corporation
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P4C168L Datasheet PDF : 14 Pages
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P4C168/P4C168L, P4C169, P4C170
Maximum Ratings(1)
Symbol Parameter
Value
Unit
VCC
Power Supply Pin with -0.5 to +7
V
Respect to GND
VTERM
Terminal Voltage with -0.5 to V CC
V
respect to GND (up to + 0.5
7.0V)
TA
Operating Temperature -55 to +125 °C
Symbol
TBIAS
TSTG
PT
IOUT
Parameter
Temperature Under
Bias
Storage Temperature
Power Dissipation
DC Output Current
Value
Unit
-55 to +125 °C
-65 to +150 °C
1.0
W
50
mA
RECOMMENDED OPERATING CONDITIONS
Grade(2)
Ambient Temp Gnd VCC
Commercial 0°C to 70°C
0V 5.0V ± 10%
Military
-55°C to +125°C 0V 5.0V ± 10%
CAPACITANCES(2)
(VCC = 5.0V, TA = 25°C, f = 1.0MHz)
Sym Parameter
Conditions
CIN Input Capacitance VIN=0V
COUT Output Capacitance VOUT=0V
Typ.
5
7
Unit
pF
pF
DC ELECTRICAL CHARACTERISTICS
Sym Parameter
Test Conditions
P4C168/169/170
Min Max
VIH Input High Voltage
VIL Input Low Voltage
2.2
-0.5(3)
VCC+0.5
0.8
VOL Output Low Voltage (TTL Load)
IOL=+8 mA, VCC=Min
VOH Output High Voltage (TTL Load)
IOH=-4 mA, VCC=Min
ILI
Input Leakage Current (Military)
Input Leakage Current (Commercial) VCC=Max, VIN=GND to VCC
0.4
2.4
-10
+10
-5
+5
ILO
Output Leakage Current (Military)
Output Leakage Current (Commer-
cial)
VCC=Max, CS=VIH, VOUT=GND to
VCC
-10
-5
+10
+5
ICC Dynamic Operating Current (Military)
—
120
Dynamic Operating Current (Com-
mercial)
VCC=Max,f=Max, Outputs Open
—
100
ISB
Standby Power Supply Current (TTL
Input Levels) (Military)
CE1≥VIH,VCC=Max,f=Max,Outputs
—
40
Standby Power Supply Current (TTL Open
Input Levels) (Commercial)
—
35
ISB1 Standby Power Supply Current
(CMOS Input Levels) (Military)
CE1≥VHC,VCC=Max,f=0,Outputs
—
20
Standby Power Supply Current
(CMOS Input Levels) (Commercial)
Open,VIN≤VLC or VIN≥VHC
—
15
P4C168L
Min Max
2.2 VCC+0.5
-0.5(3)
0.8
Unit
V
V
0.4
V
2.4
V
-5
+5
µA
-2
+2
-5
+5
µA
-2
+2
—
120 mA
—
100
—
40
mA
—
35
—
1
mA
—
0.2
Notes:
1. Stresses greater than those listed under MAXIMUM RATINGS may
cause permanent damage to the device. This is a stress rating only
and functional operation of the device at these or any other conditions
above those indicated in the operational sections of this specification
is not implied. Exposure to MAXIMUM rating conditions for extended
periods may affect reliability..
2. This parameter is sampled and not 100% tested.
3. Transient inputs with VIL and IIL not more negative than -3.0V and -100mA,
respectively, are permissible for pulse widths up to 20 ns.
Document # SRAM107 REV E
Page 2 of 14
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