LY622568 데이터 시트보기 (PDF) - Unspecified
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LY622568 Datasheet PDF : 14 Pages
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®
Rev. 2.2
LY622568
256K X 8 BIT LOW POWER CMOS SRAM
DATA RETENTION CHARACTERISTICS
PARAMETER SYMBOL
TEST CONDITION
VCC for Data Retention VDR CE# ≧ VCC - 0.2V or CE2 ≦ 0.2V
Data Retention Current
LL
VCC = 1.5V
IDR
CE# ≧ VCC - 0.2V
or CE2 ≦ 0.2V
25℃
SL
40℃
Other pins at 0.2V or VCC-0.2V
SL
Chip Disable to Data
Retention Time
tCDR
See Data Retention
Waveforms (below)
Recovery Time
tR
tRC* = Read Cycle Time
DATA RETENTION WAVEFORM
Low Vcc Data Retention Waveform (1) (CE# controlled)
MIN.
1.5
-
-
-
-
0
tRC*
TYP.
-
1
1
MAX.
5.5
20
4
UNIT
V
µA
µA
1
4
µA
1
15 µA
-
-
ns
-
-
ns
Vcc
CE#
Vcc(min.)
tCDR
VIH
VDR ≧ 1.5V
CE# ≧ Vcc-0.2V
Vcc(min.)
tR
VIH
Low Vcc Data Retention Waveform (2) (CE2 controlled)
Vcc
CE2
Vcc(min.)
tCDR
VIL
VDR ≧ 1.5V
CE2 ≦ 0.2V
Vcc(min.)
tR
VIL
Lyontek Inc. reserves the rights to change the specifications and products without notice.
5F, No. 2, Industry E. Rd. IX, Science-Based Industrial Park, Hsinchu 300, Taiwan.
TEL: 886-3-6668838
FAX: 886-3-6668836
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