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전자부품 반도체 검색엔진( 무료 PDF 다운로드 ) - 데이터시트뱅크

SPMWH1541MD5WAWMS2 데이터 시트보기 (PDF) - Samsung

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SPMWH1541MD5WAWMS2
Samsung
Samsung Samsung
SPMWH1541MD5WAWMS2 Datasheet PDF : 49 Pages
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5. Reliability Test Items and Conditions
1) Test Items
Test Item
MSL Test
Room Temperature
life test
High Temperature
life test
High Temperature
humidity life test
Low Temperature
life test
Powered Temperature
Cycle test
Thermal Shock
High Temperature
Storage
Low Temperature
Storage
ESD(HBM)
ESD(MM)
Test Conditions
125 24hrs drying 60 , 60 %RH 120hrs
260 10sec 3 cycles
25 ±3 , DC150
85 ±3 , DC150
85 ±3 , 85 %±2 %RH, DC150
-40 ±3 , DC150
-45/20 min 85/20 min, Sweep
100min cycle on/off: each 5 min, DC 150mA
-45 /15 min 125 /15 min
Hot plate 180
Ta=120 ±3
Ta=-40 ±3
R1:10 ,
R2:1.5 ,
C:100 ,
V = ±5 kV
R1:10 ,
R2: 0,
C:200 ㎊,
V = ±0.5 kV
Test
Hours/Cycles
1 cycle
1,000 hrs
1,000 hrs
1,000 hrs
1,000 hrs
100 cycle
500 cycle
1000 hrs
1000 hrs
5 times
5 times
Sample No
11
22
22
22
22
22
100
11
11
5
5
Vibration Test
20~2000~20 Hz 200 m/s2, Sweep 4 min
X, Y, Z 3 direction, each 1 cycle
4 cycles
11
Mechanical Shock Test
1500G, 0.5 ms,
3 shocks each X-Y-Z axis
5 cycles
11
2) Criteria for Judging the Damage
Item
Forward Voltage
Luminous Flux
Symbol
VF
Φv
Test Condition
IF = 65
IF = 65
Limit
Min
Max
Init. Value*0.9
Init. Value*1.1
Init. Value*0.7
Init. Value*1.2
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