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LW150Z 데이터 시트보기 (PDF) - SEOUL SEMICONDUCTOR

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LW150Z
Seoul
SEOUL SEMICONDUCTOR Seoul
LW150Z Datasheet PDF : 14 Pages
1 2 3 4 5 6 7 8 9 10 Next Last
5. RELIABILITY TESTS
Item
Condition
Life Test
High Temperature
Operating
Low Temperature
Operating
Thermal Shock
Resistance to soldering
Heat
ESD
(Human Body Model)
High Temperature
Storage
Low Temperature
Storage
Temperature Humidity
Storage
Temperature Humidity
Operating
Ta = RT, IF = 30mA
Ta = 85ºC, IF = 8mA
Ta = -30ºC, IF = 20mA
Ta = -40ºC (30min) ~ 100º (30min)
(Transfer time : 5sec, 1Cycle = 1hr)
Ts = 255 ± 5ºC, t = 10sec
1kV, 1.5kΩ ; 100pF
Ta = 100ºC
Ta = -40ºC
Ta = 85ºC, RH = 85%
Ta = 85ºC, RH = 85%
IF = 8mA
< Judging Criteria For Reliability Tests >
VF
USL 1 X 1.2
IR
USL X 2.0
IV
LSL 2 X 0.5
Notes : 1. USL : Upper Standard Level
2. LSL : Lower Standard Level.
Note
1000hrs
1000hrs
Failures
0/22
0/22
1000hrs
0/22
100cycles
0/50
1 time
0/22
1 time
0/22
1000hrs
0/22
1000hrs
0/22
1000hrs
0/22
100hrs
0/22
<060712> Rev. 0.1
LT770D
SEOUL SEMICONDUCTOR CO., LTD.
148-29, Kasan-Dong, Keumchun-Gu, Seoul, Korea
TEL : 82-2-3281-6269 FAX : 82-2-857-5430
-5-

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