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TB62706
Bi−CMOS INTEGRATED CIRCUIT SILICON MONOLITHIC
Toshiba
TB62706 Datasheet PDF : 16 Pages
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TEST CIRCUIT
DC characteristic
AC characteristic
TB62706BN/BF
PRECAUTIONS for USING
Utmost care is necessary in the design of the output line, V
CC
(V
DD
) and GND line since IC may be destroyed
due to short
−
circuit between outputs, air contamination fault, or fault by improper grounding.
7
2006-06-14
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