MC74HC373ADTG(2014) 데이터 시트보기 (PDF) - ON Semiconductor
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MC74HC373ADTG Datasheet PDF : 7 Pages
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DEVICE
UNDER
TEST
TEST POINT
OUTPUT
CL*
*Includes all probe and jig capacitance
Figure 5.
MC74HC373A
TEST CIRCUITS
DEVICE
UNDER
TEST
TEST POINT
OUTPUT
1 kW
CL*
CONNECT TO VCC WHEN
TESTING tPLZ AND tPZL.
CONNECT TO GND WHEN
TESTING tPHZ AND tPZH.
*Includes all probe and jig capacitance
Figure 6.
D0
3
DQ
D1
4
DQ
D2
7
DQ
D3
8
DQ
D4
13
DQ
D5
14
DQ
D6
17
DQ
D7
18
DQ
LE
LE
LE
LE
LE
LE
LE
LE
11
1
2
5
6
9
12
15
16
19
Q0
Q1
Q2
Q3
Q4
Q5
Q6
Q7
Figure 7. Expanded Logic Diagram
ORDERING INFORMATION
Device
Package
Shipping†
MC74HC373ADWG
SOIC−20 WIDE
(Pb−Free)
38 Units / Rail
MC74HC373ADWR2G
SOIC−20 WIDE
(Pb−Free)
1000 Units / Reel
MC74HC373ADTG
TSSOP−20
(Pb−Free)
75 Units / Rail
MC74HC373ADTR2G
TSSOP−20
(Pb−Free)
2500 Units / Reel
†For information on tape and reel specifications, including part orientation and tape sizes, please refer to our Tape and Reel Packaging
Specifications Brochure, BRD8011/D.
http://onsemi.com
5
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