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ADT7411ARQZ10

SPI®/I2C® Compatible, 10-Bit Digital Temperature Sensor and 8-Channel ADC

Analog Devices 

ADT7411

Parameter1

ROUND ROBIN UPDATE RATE2

Slow ADC @ 25°C

Averaging On

Averaging Off

Averaging On

Averaging Off

Fast ADC @ 25°C

Averaging On

Averaging Off

Averaging On

Averaging Off

ON-CHIP REFERENCE3

Reference Voltage

Temperature Coefficient

DIGITAL INPUTS1, 3

Input Current

VIL, Input Low Voltage

VIH, Input High Voltage

Pin Capacitance

SCL, SDA Glitch Rejection

DIGITAL OUTPUT

Output High Voltage, VOH

Output Low Voltage, VOL

Output High Current, IOH

Output Capacitance, COUT

INT/INT Output Saturation Voltage

I2C TIMING CHARACTERISTICS4, 5

Serial Clock Period, t1

Data In Setup Time to SCL High, t2

Data Out Stable after SCL Low, t3

SDA Low Setup Time to SCL Low

(Start Condition), t4

SDA High Hold Time after SCL High

(Stop Condition), t5

SDA and SCL Fall Time, t6

SPI TIMING CHARACTERISTICS1, 3, 6

CS to SCLK Setup Time, t1

SCLK High Pulse Width, t2

SCLK Low Pulse Width, t3

Data Access Time after SCLK

Falling Edge, t4 6

Data Setup Time Prior to SCLK

Rising Edge, t5

Data Hold Time after SCLK

Rising Edge, t6

Min Typ Max

125.4

17.1

140.36

12.11

9.26

578.96

24.62

3.25

2.25

80

±1

0.8

1.89

3

10

50

2.4

0.4

1

50

0.8

2.5

50

0

50

50

90

0

50

50

35

20

0

Unit

ms

ms

ms

ms

ms

µs

ms

ms

V

ppm/°C

µA

V

V

pF

ns

V

V

mA

pF

V

µs

ns

ns

ns

ns

ns

ns

ns

ns

ns

ns

ns

Conditions/Comments

Time to complete one measurement cycle through all

channels.

AIN1 and AIN2 are selected on Pins 7 and 8.

AIN1 and AIN2 are selected on Pins 7 and 8.

D+ and D– are selected on Pins 7 and 8.

D+ and D− are selected on Pins 7 and 8.

AIN1 and AIN2 are selected on Pins 7 and 8.

AIN1 and AIN2 are selected on pins 7 and 8.

D+ and D− are selected on Pins 7 and 8.

D+ and D− are selected on Pins 7 and 8.

VIN = 0 V to VDD.

All Digital Inputs.

Input filtering suppresses noise spikes of less than 50 ns.

ISOURCE = ISINK = 200 µA.

IOL = 3 mA.

VOH = 5 V.

IOUT = 4 mA.

Fast-Mode I2C. See Figure 2.

See Figure 2.

See Figure 2.

See Figure 2.

See Figure 2.

See Figure 3.

See Figure 3.

See Figure 3.

See Figure 3.

See Figure 3.

See Figure 3.

2 Round robin is the continuous sequential measurement of the following channels: VDD, internal temperature, external temperature (AIN1, AIN2), AIN3, AIN4, AIN5,

AIN6, AIN7, and AIN8.

3 Guaranteed by design and characterization, not production tested.

4 The SDA and SCL timing is measured with the input filters turned on so as to meet the FAST-Mode I2C specification. Switching off the input filters improves the transfer

rate, but has a negative effect on the EMC behavior of the part.

5 Guaranteed by design. Not tested in production.

6 All input signals are specified with tr = tf = 5 ns (10% to 90% of VDD), and timed from a voltage level of 1.6 V.

Rev. A | Page 4 of 36

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