74HC1GU04 데이터 시트보기 (PDF) - NXP Semiconductors.
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74HC1GU04 Datasheet PDF : 13 Pages
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Nexperia
74HC1GU04
Single unbuffered inverter
11.1. Waveform and test circuit
A input
VM(1)
tPHL
tPLH
Y output
VM(1)
Fig. 5.
VM(1) = 0.5xVCC; VI = GND to VCC.
mna046
Input to output propagation delays
PULSE
VI
GENERATOR
VCC
VO
DUT
RT
CL
50 pF
Fig. 6.
mna034
Test data is given in Table 8.
DUT = Device Under Test
CL = Load capacitance including jig and probe
capacitance.
RT = Termination resistance should be equal to
output impedance Zo of the pulse generator.
Test circuit for measuring switching times
11.2. Additional characteristics
Rbias = 560 kΩ
VCC
0.47 µF input
output 100 µF
VI
(f = 1 kHz)
gfs = ΔIO/ΔVI at VO is constant.
Fig. 7. Test set-up for measuring forward transfer conductance
A IO
GND
mna050
30
gfs
(mA / V)
20
mnb124
10
0
0
2
4
6
8
VCC (V)
Tamb = 25 °C
Fig. 8. Typical forward transconductance as a function of supply voltage
74HC1GU04
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 6 — 25 July 2018
© Nexperia B.V. 2018. All rights reserved
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