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USBUF(2006) 데이터 시트보기 (PDF) - STMicroelectronics

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USBUF
(Rev.:2006)
ST-Microelectronics
STMicroelectronics ST-Microelectronics
USBUF Datasheet PDF : 11 Pages
1 2 3 4 5 6 7 8 9 10
Technical information
USBUFxxW6
USB connectors. Distance between the USB controller and the USB connector must be
minimized.
The 47 pF (Ct) capacitors are used to bypass high frequency energy to ground and for edge
control, and are placed between the driver chip and the series termination resistors (Rt).
Both Ct and Rt should be placed as close to the driver chip as is practicable.
The USBUFxxW6 ensures a filtering protection against ElectroMagnetic and
RadioFrequency Interferences thanks to its low-pass filter structure. This filter is
characterized by the following parameters:
cut-off frequency
Insertion loss
high frequency rejection.
Figure 4.
S21 (dB)
0
USBUFxxW6 typical
attenuation
Figure 5. Measurement configuration
TEST BOARD
-10
50
Vg
50
-20
-30
1
10
100
Frequency (MHz)
1,000
2.3
ESD PROTECTION
In addition to the requirements of termination and EMC compatibility, computing devices are
required to be tested for ESD susceptibility. This test is described in the IEC 61000-4-2 and
is already in place in Europe. This test requires that a device tolerates ESD events and
remains operational without user intervention.
The USBUFxxW6 is particularly optimized to perform ESD protection. ESD protection is
based on the use of device which clamps at:
Vcl = VBR + Rd . IPP
This protection function is splitted in 2 stages. As shown in figure 6, the ESD strikes are
clamped by the first stage S1 and then its remaining overvoltage is applied to the second
stage through the resistor Rt. Such a configuration makes the output voltage very low at the
output.
4/11

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