74HCT74D(2015) 데이터 시트보기 (PDF) - NXP Semiconductors.

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74HCT74D
(Rev.:2015)

Dual D-type flip-flop with set and reset; positive edge-trigger

NXP Semiconductors. 

Nexperia

74HC74; 74HCT74

Dual D-type flip-flop with set and reset; positive edge-trigger

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SXOVH

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9,

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SXOVH

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Fig 9.

Test data is given in Table 10.

Definitions test circuit:

RT = Termination resistance should be equal to output impedance Zo of the pulse generator.

CL = Load capacitance including jig and probe capacitance.

RL = Load resistance.

S1 = Test selection switch.

Test circuit for measuring switching times

Table 10. Test data

Type

Input

VI

tr, tf

74HC74

VCC

6 ns

74HCT74

3V

6 ns

Load

CL

15 pF, 50 pF

15 pF, 50 pF

RL

1 k

1 k

Test

tPLH, tPHL

tPLH, tPHL

74HC_HCT74

Product data sheet

All information provided in this document is subject to legal disclaimers.

Rev. 5 — 3 December 2015

© Nexperia B.V. 2017. All rights reserved

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