VS-709 데이터 시트보기 (PDF) - Vectron International

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VS-709

Dual Frequency VCSO

Vectron International 

VS-709 Dual Frequency VCSO

Absolute Maximum Ratings

Parameter

Symbol

Ratings

Unit

Power Supply

Input Current

Output Current

Voltage Control Range

Output Select

Storage Temperature

Soldering Temperature / Duration

V

CC

I

IN

I

OUT

V

C

OSelect

T

STR

T /t

PEAK P

0 to 6

100

25

0 to V

CC

0 to VCC

-55 to 125

260 / 40

V

mA

mA

V

V

°C

°C / sec

Stresses in excess of the absolute maximum ratings can permanently damage the device. Also, exposure to these absolute

maximum ratings for extended periods may adversely affect device reliability. Functional operation is not implied at these or any

other conditions in excess of those represented in the operational sections of this datasheet. Permanent damage is also possible if

any device input (Vc or OS) draws >100 mA.

Test Circuits & Output Load Configuration

Functional Test: Allows use of standard power supply biasing con-

figuration. Pull down resistors are used for LV-PECL outputs and are

removed for LVDS outputs. Since the LVDS outputs are AC coupled,

the output DC levels cannots be measured.

Production Test: DC levels shown for VEE, OSelect, & Vc are for

devices configured for 3.3V operation. LV-PECL outputs are DC

coupled to 50Ω test equipment. LVDS outputs are connected to a

digital volt meter, then AC coupled to the test equipment. The digital

volt meter allows for Mid Level & Swing measurements.

LV-PECL to LV-PECL: For short transmission lengths,

the pull down resistor values shown provide reasonable power con-

sumption and waveform performance.

LVDS to LVDS: The 100Ω resistor should be removed if this load is

provided internally within the LVDS receiver.

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Vectron International • 267 Lowell Road, Hudson, NH 03051 • Tel: 1-88-VECTRON-1 • http://www.vectron.com

Rev: 15Sep2010

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