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전자부품 반도체 검색엔진( 무료 PDF 다운로드 ) - 데이터시트뱅크

UPG100P 데이터 시트보기 (PDF) - NEC => Renesas Technology

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UPG100P
NEC
NEC => Renesas Technology NEC
UPG100P Datasheet PDF : 8 Pages
1 2 3 4 5 6 7 8
PPG100P, PPG101P
RECOMMENDED CHIP ASSEMBLY CONDITIONS
Die Attachment
Atmosphere
: N2 gas
Temperature
: 320 r5 °C
AuSn Preform
: 0.5 u 0.5 u 0.05t (mm), 2 pcs.
* The hard solder such as AuSi or AuGe which has higher melting point than
AuSn should not be used.
Base Material
: CuW, Cu, KV
* Other material should not be used.
Epoxy Die Attach is not recommended.
Bonding
Machine
Wire
Temperature
Strength
Atmosphere
: TCB
* USB is not recommended
: 30 Pm diameter Au wire
: 260 r5 °C
: 31 r3 g
: N2 gas
QUALITY ASSURANCE (Refer to GET-30116)
1. 100 % Tests
1-1 100 % DC and RF Probe
1-2 Visual Inspection
MIL-STD-883/Method 2010 Condition B
2. Tests on Sampling Basis
2-1 Bond Pull Tests (In case of recommended chip handling)
MIL-STD-883 Method 2011
5 samples/wafer and 20 points tested
Accept 0/Reject 1
2-2 Tests in Standard Package
Test the electrical characteristics of chips assembled into the standard package used for PPG100B and
PPG101B.
5 samples/wafer tested
DC and RF measurement Accept 1/Reject 2
3. WARRANTEE
NEC has a responsibility of quality assurance for the products within 180 days after delivered to customers where
these are handled properly and stored in the desicater with the flow of dry N2 gas.
4. CAUTION
4-1 Take great care to prevent static electricity.
4-2 Be sure that Die Attach is performed in N2 atmosphere.
7

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