2559
Protected Quad Power Driver
ELECTRICAL CHARACTERISTICS at TA = +25°C (prefix ‘UDN’) or over operating
temperature range (prefix ‘UDK’ or ‘UDQ’), VCC = 4.75 V to 5.25 V
Characteristic
Output Leakage Current
Output Sustaining Voltage
Output Saturation Voltage
Over-Current Trip
Input Voltage
Input Current
Total Supply Current*
Symbol
ICEX
VOUT(SUS)
VOUT(SAT)
ITRIP
Logic 1
Logic 0
Logic 1
Logic 0
ICC
Test Conditions
VOUT = 50 V, VIN = 0.8 V, VEN = 2.0 V
VOUT = 50 V, VIN = 2.0 V, VEN = 0.8 V
IOUT = 100 mA, VIN = VEN = 0.8 V
All Devices, IOUT = 100 mA
All Devices, IOUT = 400 mA
B or EB package only, IOUT = 600 mA
VIN(1) or VEN(1)
VIN(0) or VEN(0)
VIN(1) or VEN(1) = 2.0 V
VIN(0) or VEN(0) = 0.8 V
All Outputs ON, VIN = VEN = 2.0 V
All Outputs OFF
Min.
—
—
40
—
—
—
—
2.0
—
—
—
—
—
Limits
Typ. Max.
<1.0 100
<1.0 100
—
—
— 300
— 500
— 700
1.0 —
—
—
— 0.8
—
40
— -10
—
80
— 5.0
Clamp Diode Forward Voltage
VF
IF = 1.0 A
IF = 1.5 A
Clamp Diode Leakage Current
IR
VR = 50 V, D1 + D2 or D3 + D4
Turn-On Delay
tPHL
IOUT = 500 mA
tPLH
IOUT = 500 mA
Thermal Limit
TJ
—
— 1.7
—
— 2.1
—
—
50
—
—
20
—
—
20
—
165 —
Typical Data is for design information only.
Negative current is defined as coming out of (sourcing) the specified terminal.
As used here, -100 is defined as greater than +10 (absolute magnitude convention) and the minimum is implicitly zero.
* All inputs simultaneously, all other tests are performed with each input tested separately.
Units
μA
μA
V
mV
mV
mV
A
V
V
μA
μA
mA
mA
V
V
μA
μs
μs
°C
Allegro MicroSystems, Inc.
5
115 Northeast Cutoff
Worcester, Massachusetts 01615-0036 U.S.A.
1.508.853.5000; www.allegromicro.com