TLP251FD4_ 데이터 시트보기 (PDF) - Toshiba
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TLP251FD4_ Datasheet PDF : 4 Pages
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TLP250(D4)SERIES,TLP251(D4)SERIES
Figure 1 Partial discharge measurement procedure according to VDE0884
Destructive test for qualification and sampling tests.
Method A
(for type and sampling tests, destructive tests)
VINITIAL (4000V for TLPxxx )
(6000V for TLPxxxF)
V
Vpr (945V for TLPxxx )
(1710V for TLPxxxF)
t1, t2
t3, t4
tp (measuring time for partial discharge)
tb
tini
=1 to 10s
=1s
=50s
=62s
0
= 10s
t1
t3
tini t2
VIORM
(630V for TLPxxx )
(1140V for TLPxxxF)
tp
t4 t
tb
Figure 2 Partial discharge measurement procedure according to VDE0884
Non-destructive test for 100% inspection.
V
Method B
(for sample test, non-destructive test)
t3, t4
=0.1s
tp (measuring time for partial discharge) =1s
tb
=1.2s
t3
tp
tb
(1180V for TLPxxx )
Vpr (2140V for TLPxxxF)
VIORM
(630V for TLPxxx )
(1140V for TLPxxxF)
t
t4
Figure 3 Dependency of maximum safety ratings on ambient temperature
Isi(mA)
200
Psi(mW)
1000
800
600
100
400
Isi←
200
→Psi
0
0
0
25
50 75 100 125 150 175
Ta (°C)
3
2002-09-25
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