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전자부품 반도체 검색엔진( 무료 PDF 다운로드 ) - 데이터시트뱅크

TA8276HQ 데이터 시트보기 (PDF) - Toshiba

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TA8276HQ Datasheet PDF : 14 Pages
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Test Circuit
TA8276HQ
1
20
6
TAB VCC1 VCC2
0.22 µF
IN1
11
C1
OUT1 (+)
9
PW-GND1 8
RL
OUT1 ()
7
0.22 µF
IN2
12
C1
0.22 µF
16
C6
AUX IN
0.22 µF
IN3
15
C1
OUT2 (+)
5
PW-GND2 2
RL
OUT2 ()
3
OUT3 (+)
17
PW-GND3 18
RL
OUT3 ()
19
0.22 µF
IN4
14
C1
OUT4 (+)
21
PW-GND4 24
RL
OUT4 ()
23
PRE-GND
13
CLIP OUT
&
DIAGNOSIS
RIP STBY OUT MUTE
10
4
25
22
: PRE-GND
: PW-GND
Components in the test circuits are only used to obtain and confirm the device characteristics.
These components and circuits do not warrant to prevent the application equipment from malfunction or failure.
9
2004-05-10

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