OP221GS(RevA) 데이터 시트보기 (PDF) - Analog Devices

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OP221GS
(Rev.:RevA)

Dual Low Power Operational Amplifier, Single or Dual Supply

Analog Devices 

OP221–SPECIFICATIONS (Matching Characteristics at Vs = ؎15 V, –55؇C ≤ TA ≤ +125؇C for OP221A,

–25؇C ≤ TA ≤ +85؇C for OP221E, –40؇C ≤ TA ≤ +85؇C for OP221G, unless otherwise noted.

Grades E and G are sample tested.)

.

OP221A/E

OP221G

Parameter

Symbol Conditions

Min Typ Max

Min Typ Max Unit

Input Offset

Voltage Match

∆VOS

Average Noninverting IB+

Bias Current

VCM = 0

100 400

100

400 800

µV

140 nA

Input Offset

Voltage Tracking

IC∆VOS

1

2

3

5

µV°C

Noninverting Input IOS+

Offset Current

VCM = 0

3

7

6

12

nA

Common-Mode

Rejection Ratio

Match (Note 1)

∆CMRR VCM = –15 V to 13.2 V

87

90

72

80

dB

Power Supply

Rejection Ratio

Match (Note 1)

∆PSRR

26

140 µV/V

NOTES

1∆CMRR is 20 log10 VCM/∆CME, where VCM is the voltage applied to both noninverting inputs and ∆CME is the difference in common-mode input-referred error.

2∆PSRR is: Input-Referred Differential Error

∆VS

Wafer Test Limits at Vs = ؎2.5 V to ؎15 V, TA = 25؇C, unless otherwise noted.

.

Parameter

Symbol

Conditions

OP221N

Limit

Unit

Input Offset Voltage

VOS

200

µV Max

Input Offset Current

IOS

VCM = 0

3.5

nA Max

Input Bias Current

IB

VCM = 0

85

nA Max

Input Voltage Range

Common-Mode

Rejection Ratio

Power Supply

Rejection Ratio

IVR

CMRR

PSRR

V+ = 5 V, V– = 0 V

VS= ± 15 V

V– = 0 V, V+ = 5 V,

0 V ≤ VCM ≤ 3.5 V

VS = ± 15 V

–15 V ≤ VCM ≤ 13.5 V

VS = ± 2.5 V to ± 15 V

V– = 0 V, V+ = 5 V to 30 V

0/3.5

–15/13.5

88

93

12.5

22.5

V Min/Max

V Min

dB Min

V/mV Min

Large-Signal

Voltage Gain

Avo

VS = ± 15 V

RL = 10 kΩ

1500

V/mV Max

Output Voltage Swing

VO

V+ = 5 V, V– = 0 V, RL= 10 kΩ

VS = 15 V, RL = 10 kΩ

0.7/4.1

± 13.8

V Min/Max

V Min

Supply Current

ISY

(Both Amplifiers)

VS = ± 2.5 V, No Load

VS = ± 15 V, No Load

560

µA Max

810

NOTE

Electrical tests are performed at wafer probe to the limits shown. Due to variations in assembly methods and normal yield loss, yield after packaging is not guaranteed

for standard product dice. Consult factory to negotiate specifications based on dice lot qualification through sample lot assembly and testing.

–4–

REV. A

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