NX3L4684GM 데이터 시트보기 (PDF) - NXP Semiconductors.
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NX3L4684GM Datasheet PDF : 24 Pages
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NXP Semiconductors
NX3L4684
Dual low-ohmic single-pole double-throw analog switch
11.1 Test circuits
VIL or VIH
VCC
nS
nY0 1
switch
nZ
nY1 2
IS
VI
GND
VI = 0.3 V or VCC − 0.3 V; VO = VCC − 0.3 V or 0.3 V.
Fig 5. Test circuit for measuring OFF-state leakage current
switch nS
1
VIH
2
VIL
VO
012aaa000
VIL or VIH
IS
VCC
nS
nY0 1
switch
nZ
nY1 2
switch nS
1
VIH
2
VIL
VI
GND
VI = 0.3 V or VCC − 0.3 V; VO = VCC − 0.3 V or 0.3 V.
Fig 6. Test circuit for measuring ON-state leakage current
VO
012aaa001
NX3L4684_4
Product data sheet
Rev. 04 — 24 March 2010
© NXP B.V. 2010. All rights reserved.
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