MM74HC597M 데이터 시트보기 (PDF) - Fairchild Semiconductor
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MM74HC597M Datasheet PDF : 8 Pages
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Absolute Maximum Ratings(Note 2)
(Note 3)
Supply Voltage (VCC)
−0.5 to +7.0V
DC Input Voltage (VIN)
−1.5 to VCC+1.5V
DC Output Voltage (VOUT)
−0.5 to VCC+0.5V
Clamp Diode Current (IIK, IOK)
±20 mA
DC Output Current, per pin (IOUT)
±25 mA
DC VCC or GND Current, per pin (ICC)
±70 mA
Storage Temperature Range (TSTG) −65°C to +150°C
Power Dissipation (PD)
(Note 4)
600 mW
S.O. Package only
500 mW
Lead Temperature (TL)
(Soldering 10 seconds)
260°C
Recommended Operating
Conditions
Min Max Units
Supply Voltage (VCC)
DC Input or Output Voltage
2
6
V
(VIN, VOUT)
0
VCC
V
Operating Temperature Range (TA) −40 +85 °C
Input Rise or Fall Times
(tr, tf) VCC = 2.0V
1000 ns
VCC = 4.5V
500 ns
VCC = 6.0V
400 ns
Note 2: Absolute Maximum Ratings are those values beyond which dam-
age to the device may occur.
Note 3: Unless otherwise specified all voltages are referenced to ground.
Note 4: Power Dissipation temperature derating — plastic “N” package: −
12 mW/°C from 65°C to 85°C.
DC Electrical Characteristics (Note 5)
Symbol
Parameter
Conditions
VCC
TA = 25°C
Typ
TA = −40 to 85°C TA = −55 to 125°C
Units
Guaranteed Limits
VIH
Minimum HIGH Level
Input Voltage
2.0V
4.5V
1.5
1.5
3.15
3.15
1.5
3.15
V
6.0V
4.2
4.2
4.2
VIL
Maximum LOW Level
Input Voltage
2.0V
4.5V
0.5
0.5
1.35
1.35
0.5
1.35
V
(Note 6)
6.0V
1.8
1.8
1.8
VOH
Minimum HIGH Level VIN = VIH or VIL
Output Voltage
|IOUT| ≤ 20 µA
2.0V
2.0
1.9
1.9
4.5V
4.5
4.4
4.4
1.9
V
4.4
6.0V
6.0
5.9
5.9
5.9
VIN = VIH or VIL
|IOUT| ≤ 4.0 mA
|IOUT| ≤ 5.2 mA
VOL
Maximum LOW Level VIN = VIH or VIL
Output Voltage
|IOUT| ≤ 20 µA
4.5V
4.2
3.98
3.84
6.0V
5.2
5.48
5.34
2.0V
0
0.1
0.1
4.5V
0
0.1
0.1
3.7
V
5.2
0.1
V
0.1
6.0V
0
0.1
0.1
0.1
VIN = VIH or VIL
|IOUT| ≤ 4 mA
4.5V
0.2
0.26
0.33
0.4
V
|IOUT| ≤ 5.2 mA
6.0V
0.2
0.26
0.33
0.4
IIN
Maximum Input Current VIN = VCC or GND
6.0V
±0.1
±1.0
±1.0
µA
ICC
Maximum Quiescent
VIN = VCC or GND
6.0V
Supply Current
IOUT = 0 µA
8.0
80
160
µA
Note 5: For a power supply of 5V ± 10% the worst case output voltages (VOH, and VOL) occur for HC at 4.5V. Thus the 4.5V values should be used when
designing with this supply. Worst case VIH and VIL occur at VCC = 5.5V and 4.5V respectively. (The VIH value at 5.5V is 3.85V.) The worst case leakage cur-
rent (IIN, ICC, and IOZ) occur for CMOS at the higher voltage and so the 6.0V values should be used.
Note 6: VIL limits are currently tested at 20% of VCC. The above VIL specification (30% of VCC) will be implemented no later than Q1, CY'89.
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