MAX4551 데이터 시트보기 (PDF) - Maxim Integrated
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MAX4551 Datasheet PDF : 16 Pages
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±15kV ESD-Protected, Quad,
Low-Voltage, SPST Analog Switches
ELECTRICAL CHARACTERISTICS—Single +3V Supply
(V+ = +2.7V to +3.6V, V- = 0, TA = TMIN to TMAX, unless otherwise noted. Typical values are at TA = +25°C.)
PARAMETER
SYMBOL
CONDITIONS
ANALOG SWITCH
Analog Signal Range
(Note 3)
VCOM_, VNO_,
VNC_
COM_ to NO_, COM_ to NC_
On-Resistance
LOGIC INPUT
IN_ Input Logic Threshold High
IN_ Input Logic Threshold Low
IN_ Input Current Logic High
or Low
RON
V+ = 2.7V, VCOM_ = 1.0V,
ICOM_ = 0.1mA
VIN_H
VIN_L
IINH_, IINL_
VIN_ = 0.8V or 2.4V
SWITCH DYNAMIC CHARACTERISTICS (Note 4)
Turn-On Time
tON
VCOM_ = 1.5V, V+ = 2.7V,
Figure 1
Turn-Off Time
tOFF
VCOM_ = 1.5V, V+ = 2.7V,
Figure 1
Break-Before-Make Time Delay
(MAX4553 Only)
tBBM
VCOM_ = 1.5V, V+ = 3.6V,
Figure 2
TA
MIN
TYP
(Note 2)
MAX UNITS
C, E
0
V+ V
+25°C
C, E
200
400
Ω
500
C, E
2.0
1.1
V
C, E
1.1
0.5 V
C, E
-1
0.03
1 µA
+25°C
C, E
+25°C
C, E
+25°C
10
190
350
ns
400
160
250
ns
300
50
ns
Charge Injection
POWER SUPPLY
V+ Supply Current
ESD PROTECTION
On NC_ and NO_ Pins
per IEC 801-2
All Pins
Q
CL = 1nF, VNO_ = 0, RS = 0,
Figure 3
+25°C
1
5 pC
+25°C
-1
0.05
1
I+
V+ = 3.6V, all VIN_ = 0 or V+
C, E
-1
µA
1
Contact Discharge IEC 1000-4-2
Air Discharge IEC 1000-4-2
Human Body Model
MIL-STD-883C Method 3015
+25°C
+25°C
+25°C
+25°C
±8
±15
kV
±15
±2.5
kV
Note 2:
Note 3:
Note 4:
Note 5:
Note 6:
Note 7:
Note 8:
Note 9:
The algebraic convention is used in this data sheet; the most negative value is shown in the minimum column.
Guaranteed by design.
∆RON = ∆RON(MAX) - ∆RON(MIN).
Resistance flatness is defined as the difference between the maximum and minimum on-resistance values, as measured
over the specified analog signal range.
Leakage parameters are 100% tested at maximum rated temperature, and guaranteed by correlation at TA = +25°C.
Off-isolation = 20log10 [ VCOM_ / (VNC_ or VNO_) ], VCOM_ = output, VNC_ or VNO_ = input to off switch.
Between any two switches.
Leakage testing for single-supply operation is guaranteed by testing with dual supplies.
_______________________________________________________________________________________ 5
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