MAR7001CB 데이터 시트보기 (PDF) - Dynex Semiconductor

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MAR7001CB

Radiation Hard 512x9 Bit FIFO

Dynex Semiconductor 

Input Pulse Levels

Input Rise and Fall Times

Input Timing Reference Levels

Output Reference Levels

Output Load

GND to 3.0V

5ns

1.5V

1.5V

See Figure 7

Figure 5: AC Test Conditions

MA7001

Output

under test

Test Point

≤50pF*

LOAD 1

* Includes jig

and scope

capacitances

Figure 7: Output Load

Symbol Parameter

Conditions

Max.

Unit

CIN

COUT

Input Capacltance (Note 1)

Output Capacitance (Notes 1 and 2)

VIN = 0V

VOUT = 0V

7

pF

12

pF

NOTES:

1. Characterized values, not currently tested.

2. With output deselected.

Figure 6: Capacitance

TRUTH TABLES

Operation

Input

Output

Pointer

R W RS RT Xl EF FF Data Read

Write

Reset

1

1

0

x

0

0

1

Z

Zero

Zero

Retransmit*

1

1

1

0

0

1

1

Z

Zero

N/C

Read

1→0 x

1

1

0

1

1 valid Increment

N/C

Read

x

x

1

1

0

0

1

Z

N/C

N/C

Write

x 1→0 1

1

0

x

1

x

N/C

Increment

Write

x

x

1

1

0

1

0

x

N/C

N/C

* Only available if less than 512 writes since last reset.

Figure 8: Single Device or Width Expansion: Read, Write, Reset and Retransmit

Operation

Reset First

Reset Rest

Input

Output

Pointer

R W RS FL Xl EF FF Data Read

Write

1

1

0

0

1

0

1

Z

1

1

0

1

1

0

1

Z

Zero

Zero

Zero

Zero

NOTES:

1. See Modes of Operation for connections of Xl and XO in depth expansion mode.

2. XI is connected to XO of previous device (Figure 12).

Figure 9: Depth Expansion: Reset and First Load

5/15

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