CDP152(2002) 데이터 시트보기 (PDF) - STMicroelectronics
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CDP152
(Rev.:2002)
(Rev.:2002)
STMicroelectronics
CDP152 Datasheet PDF : 8 Pages
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FUNCTIONAL HOLDING CURRENT (IH) TEST CIRCUIT : GO-NO GO TEST
LCDP1521
R
Surge generator
VBAT = - 100V
D.U.T
This is a GO-NO GO test which allows to confirm the holding current (IH) level in a functional test circuit.
TEST PROCEDURE :
- Adjust the current level at the IH value by short circuiting the D.U.T.
- Fire the D.U.T. with a surge current : IPP = 10A, 10/1000µs.
- The D.U.T. will come back to the off-state within a duration of 50ms max.
TEST CIRCUIT FOR VFP AND VDGL PARAMETERS
(VP is defined in unload condition)
L
R2
VP
C1
R1
R4
R3
C2
TIP
RING
GND
Pulse (µs)
Vp
C1
C2
L
R1
R2
R3
R4
IPP
Rs
tr
tp
(V) (µF) (nF) (µH) (Ω) (Ω) (Ω) (Ω) (A) (Ω)
10 700 1500 20 200
0
50
15
25
25
10 110
1.2
50 1500 1
33
0
76
13
25
25
15
60
2
10 2500 10
0
1.1 1.3
0
3
3
10 245
5/8
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