ISL705BEH 데이터 시트보기 (PDF) - Intersil
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ISL705BEH Datasheet PDF : 19 Pages
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ISL705AEH, ISL705BEH, ISL705CEH, ISL706AEH, ISL706BEH, ISL706CEH
Post Radiation Characteristics Unless otherwise specified, VDD = 4.75V to 5.5V for the ISL705AEH/BEH/CEH, VDD = 3.15V to 3.6V
for the ISL706AEH/BEH/CEH TA = +25°C. This data is typical mean test data post radiation exposure at a rate of <10mrad(Si)/s. This data is intended
to show typical parameter shifts due to low dose rate radiation. These are not limits nor are they guaranteed
40
35
30
BIASED
25
20
15
GROUNDED
10
5
0
0
25
50
75
100
125
150
krad(Si)
FIGURE 22. ISL705xEH tFPFI vs LOW DOSE RATE RADIATION
400
375
BIASED
350
325
GROUNDED
300
0
25
50
75
100
125
150
krad(Si)
FIGURE 23. ISL706xEH IDD vs LOW DOSE RATE RADIATION
3.20
3.15
BIASED
3.10
3.05
GROUNDED
3.00
2.95
0
25
50
75
100
125
150
krad(Si)
FIGURE 24. ISL706xEH VRST vs LOW DOSE RATE RADIATION
60
50
40
BIASED
30
20
GROUNDED
10
0
0
25
50
75
100
125
150
krad(Si)
FIGURE 25. ISL706xEH VHYS vs LOW DOSE RATE RADIATION
240
220
GROUNDED
200
180
160 BIASED
140
120
0
25
50
75
100
125
150
krad(Si)
FIGURE 26. ISL706xEH tRST vs LOW DOSE RATE RADIATION
2.0
1.8
1.6
BIASED
1.4
1.2
GROUNDED
1.0
0
25
50
75
100
125
150
krad(Si)
FIGURE 27. ISL706xEH tWD vs LOW DOSE RATE RADIATION
11
FN8262.0
March 30, 2012
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