ICSSSTU32864 데이터 시트보기 (PDF) - Integrated Circuit Systems

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ICSSSTU32864

25-Bit Configurable Registered Buffer

Integrated Circuit Systems 

ICSSSTU32864

DUT

Out

VDD

CL = 10 pF

(see Note 1)

RL = 50Ω

Test Point

LOAD CIRCUIT – HIGH-TO-LOW SLEW-RATE MEASUREMENT

Ou t p u t

VOH

80%

dv _f

20%

dt _f

VOL

VOLTAGE WAVEFORMS – HIGH-TO-LOW SLEW-RATE MEASUREMENT

DUT

Out

CL = 10 pF

(see Note 1)

Test Point

RL = 50Ω

LOAD CIRCUIT – LOW-TO-HIGH SLEW-RATE MEASUREMENT

dv _r

dt _r

80%

VOH

20%

Ou t put

VOL

VOLTAGE WAVEFORMS – LOW-TO-HIGH SLEW-RATE MEASUREMENT

Figure 7 — Output Slew-Rate M easurement I nfor mation (V DD = 1.8 V ± 0.1 V)

Notes: 1. CL includes probe and jig capacitance.

2. All input pulses are supplied by generators having the following characteristics: PRR ≤ 10MHz, ZO =

50Ω, input slew rate = 1 V/ns ±20% (unless otherwise specified).

0727C—04/15/04

10

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