HN27C4000G Series
AC Characteristics (VCC = 5 V ± 10%, VPP = VSS to VCC, Ta = 0 to +70°C)
Test Conditions
• Input pulse levels: 0.45 to 2.4 V
• Input rise and fall time: ≤ 10 ns
• Output load: 1 TTL gate +100 pF
• Reference levels for measuring timing: 0.8 V, 2.0 V
HN27C4000
-10
-12
-15
Parameter
Symbol Min Max Min Max Min Max Unit Test Conditions
Address to output delay
t ACC
— 100 — 120 — 150 ns CE = OE = VIL
CE to output delay
t CE
— 100 — 120 — 150 ns OE = VIL
OE to output delay
t OE
— 60 — 60 — 70 ns CE = VIL
Burst address to output delay tBAC
— 50 — 60 — 60 ns CE = VIL
OE high to output float*1
t DF
0
35 0
40 0
50 ns CE = VIL
Address to output hold
t OH
5
—5
—5
— ns CE = OE = VIL
Note: 1. tDF is defined as the time at which the output achieves the open circuit condition and data is no
longer driven.
Read Timing Waveform
Address
CE Standby mode
OE
Data Out
Active mode
tCE
Standby mode
tOE
t ACC
tDF
tOH
Data Out Valid
6