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HIP2122 데이터 시트보기 (PDF) - Intersil

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HIP2122 Datasheet PDF : 16 Pages
First Prev 11 12 13 14 15 16
HIP2122, HIP2123
Functional Description
Functional Overview
The HIP2122/23 have independent control inputs, LI and HI, for
each output; LO and HO. When LI is low, LO is low and likewise,
when HI is low, HO is low. The output negative transitions occur
with minimal (and fixed) propagation delays.
The positive transitions of each output are delayed by the
programmed delay as set by RDT. With 80k, the delay is
nominally 25ns. With 8k, the delay is nominally 220ns. Resistors
values less than 8k and greater than 80k are not recommended.
The delay time as a function of RDT is approximately
tDT(ns) = 2/RDT.
Delaying the rising edge but not the falling edge of each output is
the technique that prevents shoot-thru. Please note that there is
no logic that prevents both outputs from being on if both inputs
are on simultaneously.
The enable pin, EN, when low, drives both outputs to a low state.
When the PWM input transitions, it is necessary to insure that
both bridge FETS are not on at the same time to prevent
shoot-through currents (break before make). The programmable
dead time forces both outputs to be off before either of the
bridge FETs is driven on. An 8kresistor connected between RDT
and VSS results in a nominal dead time of 250ns. An 80k
results with a minimum nominal dead time of 50ns. Resistors
values less than 8k and greater than 80k are not recommended.
Dead-time as a function of RDT is nominally tDT(ns) = 2/RDT.
The high-side driver bias is established by the boot capacitor
connected between HB and HS. The charge on the boot capacitor
is provided by the internal boot diode that is connected to VDD.
The current path to charge the boot capacitor occurs when the
low-side bridge FET is on. This charge current is limited in
amplitude by the inherent resistance of the boot diode and by the
drain-source voltage of the low-side FET. Assuming that the on
time of the low-side FET is sufficiently long to fully charge the
boot capacitor, the boot voltage will charge very close to VDD
(less the boot diode drop and the low-side FET on voltage).
When the HI input transitions high, the high-side bridge FET is
driven on after the delay time. Because the HS node is connected
to the source of the high-side FET, the HS node will rise almost to
the level of the bridge voltage (less the conduction voltage across
the bridge FET). Because the boot capacitor voltage is referenced
to the source voltage of the high-side FET, the HB node is VDD
volts above the HS node and the boot diode is reversed biased.
Because the high-side driver circuit is referenced to the HS node,
the HO output is now approximately VHB + VBRIDGE above
ground.
During the low to high transition of the HS node, the boot
capacitor sources the necessary gate charge to fully enhance the
high-side bridge FET gate. After the gate is fully charged, the boot
capacitor no longer sources the charge to the gate but continues
to provide bias current to the high-side driver. It is clear that the
charge of the boot capacitor must be substantially larger than
the required charge of the high-side FET and high-side driver
otherwise the boot voltage will sag excessively. If the boot
capacitor value is too small for the required maximum of on-time
of the high-side FET, the high-side UV lockout may engage
resulting with an unexpected operation.
Application Information
Selecting the Boot Capacitor Value
The boot capacitor value is chosen not only to supply the internal
bias current of the high-side driver but also, and more
significantly, to provide the gate charge of the driven FET without
causing the boot voltage to sag excessively. In practice, the boot
capacitor should have a total charge that is about 20 times the
gate charge of the driven power FET for approximately a 5% drop
in voltage after the charge has been transferred from the boot
capacitor to the gate capacitance.
The following parameters are required to calculate the value of
the boot capacitor for a specific amount of voltage droop. In this
example, the values used are arbitrary. They should be changed
to comply with the actual application.
VDD = 10V
VDD can be any value between 7 and 14VDC
VHB = VDD - 0.6V = VHO High side driver bias voltage (VDD - boot diode
voltage) referenced to VHS
Period = 1ms
This is the longest expected switching period
IHB = 100µA
Worst case high side driver current when
xHO = high
(this value is specified for VDD = 12V but the
error is not significant)
RGS = 100k
Gate-source resistor
(usually not needed)
Ripple = 5%
Desired ripple voltage on the boot capacitor
(larger ripple is not recommended)
Igate_leak = 100nA
Qgate80V = 64nC
From the FET vendor’s datasheet
From Figure 21
12
ID = 33A
10
VDS = 80V
VDS = 50V
8
VDS = 20V
6
4
2
0
0 10 20 30 40 50 60 70 80
QG TOTAL GATE CHARGE (nC)
FIGURE 21. TYPICAL GATE CHARGE OF A POWER FET
The following equations calculate the total charge required for
the Period. This equation assumes that all of the parameters are
constant during the period duration. The error is insignificant if
the ripple is small.
11
FN7670.0
December 23, 2011

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