HA-5101/883 데이터 시트보기 (PDF) - Intersil
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HA-5101/883 Datasheet PDF : 16 Pages
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HA-5101/883
TABLE 3. ELECTRICAL PERFORMANCE CHARACTERISTICS
Device Characterized at: VS= ±15V, RL = 2kΩ, CL = 50pF, AV = +1, Unless Otherwise Specified
LIMITS
PARAMETER
SYMBOL
TEST CONDITIONS
NOTES TEMP (°C) MIN
MAX UNITS
Differential Input Resistance
Low Frequency Peak-to-Peak Noise
Input Noise Voltage Density
Input Noise Current Density
Unity Gain Bandwidth
Full Power Bandwidth
Minimum Closed Loop Stable Gain
RIN
EnP-P
En
In
UGBW
FPBW
CLSG
VCM = 0V
0.1Hz to 10Hz
RS = 20Ω, fo = 1000Hz
RS = 2MΩ, fo = 1000Hz
VO = 100mV
VPEAK = 10V
1
+25
250
1
+25
-
1
+25
-
1
+25
-
1
+25
10
1, 2
+25
95
1
-55 to +125 +1
-
kΩ
0.2
µVP-P
4.5
nV/√Hz
3
pA/√Hz
-
MHz
-
kHz
-
V/V
Output Resistance
ROUT Open Loop
1
+25
-
150
Ω
Quiescent Power Consumption
PC
VOUT = 0V, IOUT = 0mA
1, 3
-55 to +125
-
180
mW
NOTES:
1. Parameters listed in Table 3 are controlled via design or process parameters and are not directly tested at final production. These parameters
are lab characterized upon initial design release, or upon design changes. These parameters are guaranteed by characterization based upon
data from multiple production runs which reflect lot to lot and within lot variation.
2. Full Power Bandwidth guarantee based on Slew Rate measurement using FPBW = Slew Rate/(2πVPEAK).
3. Quiescent Power Consumption based upon Quiescent Supply Current test maximum. (No load on outputs.)
4. Offset adjustment range is [VIO (Measured) ±1mV] minimum referred to output. This test is for functionality only to assure adjustment through 0V.
TABLE 4. ELECTRICAL TEST REQUIREMENTS
MIL-STD-883 TEST REQUIREMENTS
SUBGROUPS (SEE TABLES 1 & 2)
Interim Electrical Parameters (Pre Burn-in)
1
Final Electrical Test Parameters
1*, 2, 3, 4, 5, 6
Group A Test Requirements
1, 2, 3, 4, 5, 6
Groups C & D Endpoints
1
*PDA applies to Subgroup 1 only.
4
FN3931.1
August 17, 2005
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