HA-2548/883 데이터 시트보기 (PDF) - Intersil
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HA-2548/883 Datasheet PDF : 7 Pages
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HA-2548/883
TABLE 3. ELECTRICAL PERFORMANCE CHARACTERISTICS (Continued)
Device Characterized at: VSUPPLY = ±15V, RLOAD = 1kΩ, CLOAD ≤ 10pF, Unless Otherwise Specified.
PARAMETERS
SYMBOL
CONDITIONS
NOTES
TEMP. (oC)
MIN
MAX UNITS
Minimum Closed Loop
Stable Gain
CLSG RL = 1kΩ, CL = 10pF
2
-55 to 125
5
-
V/V
Rise and Fall Time
tr
VOUT = -100mV
2, 5
to +100mV
2, 5
25
-55 to 125
-
15
ns
-
20
ns
tf
VOUT = +100mV
2, 5
to -100mV
2, 5
25
-55 to 125
-
15
ns
-
20
ns
Overshoot
+OS
VOUT = -100mV
2
to +100mV
2
25
-55 to 125
-
30
%
-
35
%
-OS
VOUT = +100mV
2
to -100mV
2
25
-55 to 125
-
30
%
-
35
%
Settling Time
tS
To 0.01% for a 10V
2
Step
25
-
260
ns
Power Consumption
PC
VOUT = 0V,
IOUT = 0mA
2, 4
-55 to 125
-
540
mW
NOTES:
2. Parameters listed in Table 3 are controlled via design or process parameters and are not directly tested at final production. These param-
eters are lab characterized upon initial design release, or upon design changes. These parameters are guaranteed by characterization
based upon data from multiple production runs which reflect lot to lot and within lot variation.
3. Full Power Bandwidth guarantee based on Slew Rate measurement using FPBW = Slew Rate/(2πVPEAK).
4. Power Consumption based upon Quiescent Supply Current test maximum. (No load on outputs.)
5. Measured between 10% and 90% points.
6. Offset adjustment range is [VIO(Measured) ±1mV] minimum referred to output. This test is for functionality only to assure adjustment
through 0V.
TABLE 4. ELECTRICAL TEST REQUIREMENTS
MIL-STD-883 TEST REQUIREMENTS
SUBGROUPS (SEE TABLE 1)
Interim Electrical Parameters (Pre Burn-In)
1
Final Electrical Test Parameters
1 (Note 7), 2, 3, 4, 5, 6
Group A Test Requirements
1, 2, 3, 4, 5, 6
Groups C and D Endpoints
1
NOTE:
7. PDA applies to Subgroup 1 only.
Spec Number 511069-883
4
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