GX434 데이터 시트보기 (PDF) - Gennum -> Semtech

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GX434

Monolithic 4x1 Video Multiplexer

Gennum -> Semtech 

10 mV/div

0.1 V/div

0.5 µs/div

Fig.3 Switching Transient (crosspoint to crosspoint)

Chip disabled crosstalk = 20 log

VIN

VOUT

VOUT

ENABLED

VIN

CROSSPOINT

37.5 Ω

Fig. 5 Chip Disabled Crosstalk Test Circuit

1 µs/div

Fig. 4 Switching Envelope (crosspoint to crosspoint)

All hostile crosstalk = 20 log

RIN

VOUT

VIN

VOUT

VIN

R

L

≥10

kΩ

Fig. 6 All Hostile Crosstalk Test Circuit

BLANKING LEVEL

10 µH

10 µH

LUMINANCE LEVEL

8V

CONTROL BIT

FROM I/O PORT

R.F. SIGNAL

SOURCE

75 Ω

3.9 kΩ

220 Ω

RELAY SWITCH

150 Ω

0.1µF

AC

COUPLING

150 Ω

DUT

R

L

CL

BUFFER

AMP

x2

75 Ω

75 Ω

Fig. 7 Differential Phase and Gain Test Circuit

DIFFERENTIAL GAIN AND PHASE TEST CIRCUIT

The test circuit of Figure 7 allows two DC bias levels, set by

the user, to be superimposed on a high frequency signal

source. A computer controlled relay selects either the preset

blanking or luminance level. One measurement is taken at

each level and the change in gain or phase is calculated.

This procedure is repeated one hundred times to provide a

reasonably large sample.

The results are averaged to reduce the standard deviation

and therefore improve the accuracy of the measurement.

The output from the device under test is AC coupled to a

buffer amplifier which allows the buffer to operate at a

constant luminance level so that it does not contribute any dg

or dp to the measurement.

510 -34 -2

6

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