HI-524(2002) 데이터 시트보기 (PDF) - Intersil

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HI-524
(Rev.:2002)

4-Channel Wideband and Video Multiplexer

Intersil 

HI-524

Test Circuits and Waveforms TA = 25oC, VSUPPLY = ±15V, VAH = 2.4V, VAL = 0.8V, Unless Otherwise Specified

ID(ON)

1.0

IS(OFF)

ID(OFF)

0.1

0

25

50

75 100 125 150

TEMPERATURE (oC)

FIGURE 2A. LEAKAGE CURRENT vs TEMPERATURE

±10V

EN

0.8V

OUT

A ID(OFF)

10V

FIGURE 2B. ID(OFF) TEST CIRCUIT (NOTE 8)

A IS(OFF)

±10V

10V

OUT

0.8V

EN

OUT

A0

A1 EN

10V

A ID(ON)

±10V

+2.4V

FIGURE 2C. IS(OFF) TEST CIRCUIT (NOTE 8)

FIGURE 2D. ID(ON) TEST CIRCUIT (NOTE 8)

FIGURE 2. LEAKAGE CURRENTS

IN1

±3V

IN2

IN3

HA-524

HA-2541

2

18

+

-

OUTPUT

20pF

75Ω

16

(NOTE 10)

IN4

3V

A0 A1 EN

5V

VA

50Ω

1.6V

+3V

ADDRESS DRIVE (VA)

VAH = 2.4V

VAL = 0.8V

ACCESS TIME, tA

SETTLING TIME, tS

HA-2541

OUTPUT

10%

-3V

± 0.1% OF FULL SCALE

(OR ±0.01%)

FIGURE 3A. TEST CIRCUIT

FIGURE 3B. MEASUREMENT POINTS

FIGURE 3. SETTLING TIME, ACCESS TIME, BREAK-BEFORE-MAKE DELAY (NOTE 9)

NOTES:

8. Two measurements per channel: ±10V and 10V. (Two measurements per device for ID(OFF) ±10V and 10V.)

9. The Break-Before-Make test requires inputs 1 and 4 at the same voltage.

10. Capacitor value may be selected to optimize AC performance.

4

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