CY7C136-55JXI 데이터 시트보기 (PDF) - Cypress Semiconductor
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CY7C136-55JXI Datasheet PDF : 18 Pages
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CY7C132/CY7C136
CY7C142/CY7C146
Maximum Ratings
DC Input Voltage ................................................. −3.5V to +7.0V
(Above which the useful life may be impaired. For user guide-
lines, not tested.)
Storage Temperature ..................................... −65°C to +150°C
Ambient Temperature with
Power Applied.................................................. −55°C to +125°C
Output Current into Outputs (LOW)............................. 20 mA
Static Discharge Voltage.......................................... > 2001V
(per MIL-STD-883, Method 3015)
Latch-up Current.................................................... > 200 mA
Operating Range
Supply Voltage to Ground Potential
(Pin 48 to Pin 24).................................................−0.5V to +7.0V
DC Voltage Applied to Outputs
in High-Z State .....................................................−0.5V to +7.0V
Range
Commercial
Industrial
Military[4]
Ambient Temperature
0°C to +70°C
–40°C to +85–C
–55°C to +125°C
VCC
5V ± 10%
5V ± 10%
5V ± 10%
Electrical Characteristics Over the Operating Range[5]
7C132-30[3] 7C132-35,45 7C132-55
7C136-25,30 7C136-35,45 7C136-55
7C136-15[3] 7C142-30 7C142-35,45 7C142-55
7C146-15 7C146-25,30 7C146-35,45 7C146-55
Parameter Description
Test Conditions
Min. Max. Min. Max. Min. Max. Min. Max. Unit
VOH
Output HIGH voltage VCC = Min., IOH = –4.0 mA
2.4
2.4
2.4
2.4
V
VOL
Output LOW voltage IOL = 4.0 mA
IOL = 16.0 mA[6]
0.4
0.4
0.4
0.4 V
0.5
0.5
0.5
0.5
VIH
Input HIGH voltage
2.2
2.2
2.2
2.2
V
VIL
Input LOW voltage
0.8
0.8
0.8
0.8 V
IIX
Input load current GND < VI < VCC
–5 +5 −5 +5 −5 +5 −5 +5 µA
IOZ
Output leakage
GND < VO < VCC, Output Disabled –5 +5 −5 +5 −5 +5 −5 +5 µA
current
IOS
Output short circuit
current[7]
VCC = Max., VOUT = GND
–350
−350
−350
−350 mA
ICC
VCC Operating
Supply Current
CfMEAX=[8V] IL, Outputs Open, f =
Com’l
Mil
190
170
120
110 mA
170
120
ISB1
Standby current both
ports, TTL Inputs
fC=ELfMaAnXd[8C] ER > VIH,
Com’l
Mil
75
65
45
35 mA
65
45
ISB2
Standby Current
CEL or CER > VIH,
Com’l
135
115
90
75 mA
One Port,
TTL Inputs
Active Port Outputs Open,
f = fMAX[8]
Mil
115
90
ISB3
Standby Current
Both Ports CEL and
Com’l
15
15
15
15 mA
Both Ports,
CER > VCC – 0.2V,
Mil
15
15
CMOS Inputs
VIN > VCC – 0.2V or
VIN < 0.2V, f = 0
ISB4
Standby Current
One Port CEL or CER > VCC – Com’l
125
105
85
70 mA
One Port,
CMOS Inputs
0.2V, VIN > VCC – 0.2V or VIN <
0.2V, Active Port Outputs Open,
Mil
105
85
f = fMAX[8]
Capacitance[9]
Parameter
Description
Test Conditions
Max.
Unit
CIN
COUT
Input Capacitance
Output Capacitance
TA = 25°C, f = 1 MHz,
VCC = 5.0V
15
pF
10
pF
Shaded areas contain preliminary information.
Notes:
4. TA is the “instant on” case temperature.
5. See the last page of this specification for Group A subgroup testing information.
6. BUSY and INT pins only.
7. Duration of the short circuit should not exceed 30 seconds.
8. At f = fMAX, address and data inputs are cycling at the maximum frequency of read cycle of 1/trc and using AC Test Waveforms input levels of GND to 3V.
9. This parameter is guaranteed but not tested.
Document #: 38-06031 Rev. *C
Page 3 of 18
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