EVAL-ADN2806EB(Rev0) 데이터 시트보기 (PDF) - Analog Devices
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EVAL-ADN2806EB Datasheet PDF : 20 Pages
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ABSOLUTE MAXIMUM RATINGS
TA = TMIN to TMAX, VCC = VMIN to VMAX, VEE = 0 V, CF =
0.47 μF, unless otherwise noted.
Table 4.
Parameter
Supply Voltage (VCC)
Minimum Input Voltage (All Inputs)
Maximum Input Voltage (All Inputs)
Maximum Junction Temperature
Storage Temperature Range
Rating
4.2 V
VEE − 0.4 V
VCC + 0.4 V
125°C
−65°C to +150°C
ADN2806
Stress above those listed under Absolute Maximum Ratings may
cause permanent damage to the device. This is a stress rating
only; functional operation of the device at these or any other
conditions above those indicated in the operational sections of
this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
THERMAL CHARACTERISTICS
Thermal Resistance
32-lead LFCSP, 4-layer board with exposed paddle soldered to
VEE, θJA = 28°C/W.
ESD CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on
the human body and test equipment and can discharge without detection. Although this product features
proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy
electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance
degradation or loss of functionality.
Rev. 0 | Page 5 of 20
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