74V2T08 데이터 시트보기 (PDF) - STMicroelectronics

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74V2T08

DUAL 2-INPUT AND GATE

STMicroelectronics 

74V2T08

DC SPECIFICATION

Symbol

Parameter

VIH High Level Input

Voltage

VIL Low Level Input

Voltage

VOH High Level Ouput

Voltage

VOL Low Level Output

Voltage

II

ICC

ICC

Input Leakage

Current

Quiescent Supply

Current

Additional Worst

Case Supply

Current

Test Condition

Value

VCC

TA = 25°C

-40 to 85°C -55 to 125°C Unit

(V)

Min. Typ. Max. Min. Max. Min. Max.

4.5 to

5.5

2

2

2

V

4.5 to

5.5

0.8

0.8

0.8 V

4.5

IO=-50 µA

4.4 4.5

4.4

4.4

V

4.5

IO=-8 mA

3.94

3.8

3.7

4.5

IO=50 µA

4.5

IO=8 mA

0.0 0.1

0.1

0.1

V

0.36

0.44

0.55

0 to

5.5

VI = 5.5V or GND

± 0.1

±1

± 1 µA

5.5 VI = VCC or GND

1

10

20 µA

One Input at 3.4V,

5.5 other input at VCC

or GND

1.35

1.5

1.5 mA

AC ELECTRICAL CHARACTERISTICS (Input tr = tf = 3ns)

Test Condition

Value

Symbol

Parameter

VCC CL

(V) (pF)

tPLH tPHL Propagation Delay 5.0(**) 15

Time

5.0(**) 50

(*) Voltage range is 3.3V ± 0.3V

(**) Voltage range is 5.0V ± 0.5V

TA = 25°C

-40 to 85°C -55 to 125°C Unit

Min. Typ. Max. Min. Max. Min. Max.

3.8 5.5 1.0 6.5 1.0 7.5

ns

4.3 6.5 1.0 7.5 1.0 8.5

CAPACITANCE CHARACTERISTICS

Test Condition

Value

Symbol

Parameter

TA = 25°C

-40 to 85°C -55 to 125°C Unit

Min. Typ. Max. Min. Max. Min. Max.

CIN Input Capacitance

4 10

10

10 pF

CPD Power Dissipation

Capacitance

19

pF

(note 1)

1) CPD is defined as the value of the IC’s internal equivqlent capacitance which is calculated from the operating current consumption without

load. (Refer to Test Circuit). Average current cqn be obtqined by the following equation. ICC(opr) = CPD x VCC x fIN + ICC/2

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