74V2T00(2003) 데이터 시트보기 (PDF) - STMicroelectronics

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74V2T00
(Rev.:2003)

DUAL 2-INPUT NAND GATE

STMicroelectronics 

74V2T00

DC SPECIFICATION

Test Condition

Value

Symbol

Parameter

VIH

VIL

VOH

VOL

II

ICC

∆ICC

High Level Input

Voltage

Low Level Input

Voltage

High Level Output

Voltage

Low Level Output

Voltage

Input Leakage

Current

Quiescent Supply

Current

Additional Worst

Case Supply

Current

VCC

(V)

4.5 to

5.5

4.5 to

5.5

4.5

4.5

4.5

4.5

0 to

5.5

IO=-50 µA

IO=-8 mA

IO=50 µA

IO=8 mA

VI = 5.5V or GND

5.5 VI = VCC or GND

One Input at 3.4V,

5.5 other input at VCC

or GND

TA = 25°C

-40 to 85°C -55 to 125°C Unit

Min. Typ. Max. Min. Max. Min. Max.

2

2

2

V

0.8

0.8

0.8 V

4.4 4.5

4.4

4.4

V

3.94

3.8

3.7

0.0 0.1

0.1

0.1 V

0.36

0.44

0.55

± 0.1

± 1.0

± 1.0 µA

1

10

20 µA

1.35

1.5

1.5 mA

AC ELECTRICAL CHARACTERISTICS (Input tr = tf = 3ns)

Test Condition

Value

Symbol

Parameter

VCC CL

(V) (pF)

tPLH Propagation Delay 5.0 (*) 15

tPHL Time

5.0 (*) 50

TA = 25°C

-40 to 85°C -55 to 125°C Unit

Min. Typ. Max. Min. Max. Min. Max.

5.0 7.0 1.0 8.0 1.0 8.0

ns

5.5 8.0 1.0 9.0 1.0 9.0

(*) Voltage range is 5.0V ± 0.5V

CAPACITANCE CHARACTERISTICS

Test Condition

Value

Symbol

Parameter

CIN Input Capacitance

CPD Power Dissipation

Capacitance

(note 1)

TA = 25°C

-40 to 85°C -55 to 125°C Unit

Min. Typ. Max. Min. Max. Min. Max.

4 10

10

10 pF

10.5

pF

1) CPD is defined as the value of the IC’s internal equivalent capacitance which is calculated from the operating current consumption without

load. (Refer to Test Circuit). Average current can be obtained by the following equation. ICC(opr) = CPD x VCC x fIN + ICC/2

3/7

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