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74F825 데이터 시트보기 (PDF) - Fairchild Semiconductor

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74F825
Fairchild
Fairchild Semiconductor Fairchild
74F825 Datasheet PDF : 6 Pages
1 2 3 4 5 6
Absolute Maximum Ratings(Note 1)
Storage Temperature
65°C to +150°C
Ambient Temperature under Bias
55°C to +125°C
Junction Temperature under Bias
55°C to +150°C
VCC Pin Potential to Ground Pin
Input Voltage (Note 2)
0.5V to +7.0V
0.5V to +7.0V
Input Current (Note 2)
30 mA to +5.0 mA
Voltage Applied to Output
in HIGH State (with VCC = 0V)
Standard Output
3-STATE Output
0.5V to VCC
0.5V to +5.5V
Current Applied to Output
in LOW State (Max)
twice the rated IOL (mA)
Recommended Operating
Conditions
Free Air Ambient Temperature
Supply Voltage
0°C to +70°C
+4.5V to +5.5V
Note 1: Absolute maximum ratings are values beyond which the device
may be damaged or have its useful life impaired. Functional operation
under these conditions is not implied.
Note 2: Either voltage limit or current limit is sufficient to protect inputs.
DC Electrical Characteristics
Symbol
Parameter
Min
Typ
Max
Units
VCC
Conditions
VIH
Input HIGH Voltage
2.0
VIL
Input LOW Voltage
VCD
Input Clamp Diode Voltage
VOH
Output HIGH
10% VCC
2.5
Voltage
10% VCC
2.4
5% VCC
2.7
5% VCC
2.7
VOL
Output LOW Voltage
10% VCC
IIH
Input HIGH
Current
V
Recognized as a HIGH Signal
0.8
V
Recognized as a LOW Signal
1.2
V
Min IIN = −18 mA
IOH = −1 mA
V
Min
IOH = −3 mA
IOH = −1 mA
IOH = −3 mA
0.5
V
Min IOL = 24 mA
5.0
µA
Max VIN = 2.7V
IBVI
Input HIGH Current
Breakdown Test
7.0
µA
Max VIN = 7.0V
ICEX
Output HIGH
Leakage Current
50
µA
Max VOUT = VCC
VID
Input Leakage
Test
4.75
V
0.0
IID = 1.9 µA
All Other Pins Grounded
IOD
Output Leakage
Circuit Current
3.75
µA
0.0
VIOD = 150 mV
All Other Pins Grounded
IIL
IOZH
IOZL
IOS
IZZ
ICCZ
Input LOW Current
Output Leakage Current
Output Leakage Current
Output Short-Circuit Current
Buss Drainage Test
Power Supply Current
0.6
mA
Max VIN = 0.5V
50
µA
Max VOUT = 2.7V
50
µA
Max VOUT = 0.5V
60
150
mA
Max VOUT = 0V
500
µA
0.0V VOUT = 5.25V
75
90
mA
Max VO = HIGH Z
3
www.fairchildsemi.com

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