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74F253

Dual 4-bit input multiplexer (3-State)

Philips Electronics 

Philips Semiconductors

Dual 4-input multiplexer (3-State)

Product specification

74F253

DC ELECTRICAL CHARACTERISTICS

(Over recommended operating free-air temperature range unless otherwise noted.)

SYMBOL

PARAMETER

TEST CONDITIONSNO TAG

LIMITS

MIN

TYP

NO TAG

MAX

UNIT

VOH

High-level output voltage

VCC = MIN, VIL = MAX,

VIH = MIN, IOH = MAX

VOL

Low-level output voltage

VCC = MIN, VIL = MAX,

VIH = MIN, IOL = MAX

VIK

Input clamp voltage

VCC = MIN, II = IIK

II

Input current at maximum input

voltage

VCC = MAX, VI = 7.0V

±10%VCC 2.4

V

±5%VCC 2.7

3.3

V

±10%VCC

0.35 0.50

V

±5%VCC

0.35 0.50

V

–0.73 –1.2

V

100

µA

IIH

IIL

IOZH

High-level input current

Low-level input current

Off-state output current

High-level voltage applied

VCC = MAX, VI = 2.7V

VCC = MAX, VI = 0.5V

VCC = MAX, VO = 2.7V

20

µA

–0.6 mA

50

µA

IOZL

Off-state output current

Low-level voltage applied

VCC = MAX, VO= 0.5V

–50

µA

IOS

Short-circuit output currentNO TAG

VCC = MAX

–60

–150 mA

ICCH

OEn=GND, Sn=In=4.5V

10

16

mA

ICC

Supply current (total) ICCL

VCC = MAX

OEn=Sn=In=GND

12

23

mA

ICCZ

OEn=4.5V, Sn=In=GND

14

23

mA

NOTES:

1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.

2. All typical values are at VCC = 5V, Tamb = 25°C.

3. Not more than one output should be shorted at a time. For testing IOS, the use of high-speed test apparatus and/or sample-and-hold

techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting

of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any

sequence of parameter tests, IOS tests should be performed last.

1988 Nov 29

5

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