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N74F1245D

Octal transceiver (3-State)

Philips Electronics 

Philips Semiconductors

Octal transceiver (3-State)

Product specification

74F1245

RECOMMENDED OPERATING CONDITIONS

SYMBOL

PARAMETER

VCC

Supply voltage

VIH

High-level input voltage

VIL

Low-level input voltage

IIK

Input clamp current

IOH

High-level output current

IOL

Tamb

Low-level output current

Operating free-air temperature range

A0–A7

B0–B7

A0–A7

B0–B7

LIMITS

MIN

NOM

MAX

4.5

5.0

5.5

2.0

0.8

–18

–3

–15

24

64

0

70

UNIT

V

V

V

mA

mA

mA

mA

mA

°C

DC ELECTRICAL CHARACTERISTICS

(Over recommended operating free-air temperature range unless otherwise noted.)

SYMBOL

PARAMETER

TEST CONDITIONSNO TAG

LIMITS

MIN

TYP

NO TAG

MAX

UNIT

VOH

High-level output voltage

A0–A7, B0–B7

VCC = MIN,

VIL = MAX,

IOH = –3mA ±10% VCC

2.4

±5% VCC 2.7

3.3

V

V

B0–B7

VIH = MIN

IOH = –15mA ±10% VCC

2.0

V

±5% VCC 2.0

V

A0–A7

VOL

Low-level output voltage

B0–B7

VCC = MIN,

VIL = MAX,

VIH = MIN

IOL = 24mA

IOL = 48mA

IOL = 64mA

±10% VCC

±5% VCC

±10% VCC

±5% VCC

0.35 0.50

V

0.35 0.50

V

0.30 0.55

V

0.42 0.55

V

VIK

Input clamp voltage

VCC = MIN, II = IIK

–0.73 –1.2

V

II

Input current at maximum

input voltage

OE, T/R

A0–A7, B0–B7

VCC = 0.0V, VI = 7.0V

VCC = 0.0V, VI = 5.5V

100

µA

100

µA

IIH

High-level input current

OE, T/R only VCC = MAX, VI = 2.7V

40

µA

IIL

Low-level input current

OE, T/R only VCC = MAX, VI = 0.5V

–20

µA

IIH+IOZH

Off-state output current

High-level voltage applied

VCC = MAX, VO = 2.7V

70

µA

IIL+IOZL

Off-state output current

Low-level voltage applied

VCC = MAX, VO = 0.5V

–70

µA

IOS

Short-circuit output

currentNO TAG

ICC

Supply current (total)

A0–A7

B0–B7

ICCH

ICCL

ICCZ

VCC = MAX

VCC = MAX

–60

–150 mA

–100

–225 mA

120 155 mA

116 150 mA

110 165 mA

NOTES:

1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.

2. All typical values are at VCC = 5V, Tamb = 25°C.

3. Not more than one output should be shorted at a time. For testing IOS, the use of high-speed test apparatus and/or sample-and-hold

techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting

of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any

sequence of parameter tests, IOS tests should be performed last.

1995 Mar 01

4

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