74AHC377 데이터 시트보기 (PDF) - NXP Semiconductors.
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74AHC377 Datasheet PDF : 16 Pages
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NXP Semiconductors
74AHC377; 74AHCT377
Octal D-type flip-flop with data enable; positive-edge trigger
VI 90 %
tW
negative
pulse
VM
GND
10 %
tf
tr
VI
90 %
positive
pulse
VM
10 %
GND
tW
VCC
VI
G
DUT
RT
VM
tr
tf
VM
VO
CL
001aah768
Fig 8.
Test data is given in Table 9.
Definitions test circuit:
RT = termination resistance should be equal to output impedance Zo of the pulse generator.
CL = load capacitance including jig and probe capacitance.
Load circuitry for measuring switching times
Table 9. Test data
Type
74AHC377
74AHCT377
Input
VI
VCC
3.0 V
tr, tf
≤ 3.0 ns
≤ 3.0 ns
Load
CL
15 pF, 50 pF
15 pF, 50 pF
Test
tPLH, tPHL
tPLH, tPHL
74AHC_AHCT377_2
Product data sheet
Rev. 02 — 12 June 2008
© NXP B.V. 2008. All rights reserved.
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