74HC595BQ-Q100 데이터 시트보기 (PDF) - NXP Semiconductors.

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74HC595BQ-Q100

8-bit serial-in, serial or parallel-out shift register with output latches; 3-state

NXP Semiconductors. 

NXP Semiconductors

74HC595-Q100; 74HCT595-Q100

8-bit serial-in, serial or parallel-out shift register with output latches;

3-state

tW

VI 90 %

negative

pulse

VM

10 %

0V

tf

VI

positive

pulse

tr

90 %

VM

10 %

0V

tW

VM

tr

tf

VM

VI

G

VCC

VO

DUT

RT

VCC

RL S1

CL

open

001aad983

Test data is given in Table 9.

Definitions for test circuit:

CL = load capacitance including jig and probe capacitance.

RL = load resistance.

RT = termination resistance should be equal to the output impedance Zo of the pulse generator.

S1 = test selection switch.

Fig 14. Test circuit for measuring switching times

Table 9. Test data

Type

Input

VI

tr, tf

74HC595-Q100 VCC

6 ns

74HCT595-Q100 3 V

6 ns

Load

CL

50 pF

50 pF

RL

1 k

1 k

S1 position

tPHL, tPLH

open

open

tPZH, tPHZ

GND

GND

tPZL, tPLZ

VCC

VCC

74HC_HCT595_Q100

Product data sheet

All information provided in this document is subject to legal disclaimers.

Rev. 2 — 10 April 2013

© NXP B.V. 2013. All rights reserved.

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