TC74AC32FN 데이터 시트보기 (PDF) - Toshiba
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TC74AC32FN Datasheet PDF : 9 Pages
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Pin Assignment
TC74AC32P/F/FN/FT
IEC Logic Symbol
1A 1
1B 2
1Y 3
2A 4
2B 5
2Y 6
GND 7
(top view)
Truth Table
A
B
Y
H
H
H
L
H
H
H
L
H
L
L
L
14 VCC
13 4B
12 4A
11 4Y
10 3B
9 3A
8 3Y
1A (1)
>1
1B (2)
2A (4)
2B (5)
3A (9)
3B (10)
4A (12)
4B (13)
(3) 1Y
(6) 2Y
(8) 3Y
(11) 4Y
Absolute Maximum Ratings (Note 1)
Characteristics
Symbol
Rating
Unit
Supply voltage range
DC input voltage
DC output voltage
Input diode current
Output diode current
DC output current
DC VCC/ground current
Power dissipation
Storage temperature
VCC
VIN
VOUT
IIK
IOK
IOUT
ICC
PD
Tstg
−0.5 to 7.0
V
−0.5 to VCC + 0.5
V
−0.5 to VCC + 0.5
V
±20
mA
±50
mA
±50
mA
±100
mA
500 (DIP) (Note 2)/180 (SOP/TSSOP)
mW
−65 to 150
°C
Note 1:
Exceeding any of the absolute maximum ratings, even briefly, lead to deterioration in IC performance or
even destruction.
Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly
even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute
maximum ratings and the operating ranges.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook
(“Handling Precautions”/Derating Concept and Methods) and individual reliability data (i.e. reliability test
report and estimated failure rate, etc).
Note 2: 500 mW in the range of Ta = −40 to 65°C. From Ta = 65 to 85°C a derating factor of −10 mW/°C should be
applied up to 300 mW.
2
2007-10-01
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