FSTU32160MTD 데이터 시트보기 (PDF) - Fairchild Semiconductor

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FSTU32160MTD

16-Bit to 32-Bit Multiplexer/Demultiplexer Bus Switch with −2V Undershoot Protection

Fairchild Semiconductor 

AC Electrical Characteristics

TA = −40 °C to +85 °C,

Symbol

Parameter

CL = 50 pF, RU= RD = 500Ω

VCC = 4.5 − 5.5V

VCC = 4.0V

Units

Conditions

Figure

No.

Min

Max

Min

Max

tPHL, tPLH

A or B, to B or A (Note 7)

0.25

0.25

ns VI = OPEN

Figures

2, 3

tPZH

Output Enable Time,

S to A, B

7.0

30.0

35.0

ns

VI = OPEN for tPZH

BiasV = GND

Figures

2, 3

tPZL

Output Enable Time,

S to A, B

7.0

30.0

35.0

ns

VI = 7V for tPZL

BiasV = 3V

Figures

2, 3

tPHZ

Output Disable Time,

S to A, B

1.0

6.9

7.3

ns

VI = OPEN for tPHZ

BiasV = GND

Figures

2, 3

tPLZ

Output Disable Time,

S to A, B

1.0

7.7

7.7

ns

VI = 7V for tPLZ,

BiasV = 3V

Figures

2, 3

Note 7: This parameter is guaranteed by design but is not tested. The bus switch contributes no propagation delay other than the RC delay of the typical On

resistance of the switch and the 50pF load capacitance, when driven by an ideal voltage source (zero output impedance).

Capacitance (Note 8)

Symbol

Parameter

Typ

CIN

Control pin Input Capacitance

4

CI/O OFF

Input/Output Capacitance “OFF State”

8

Note 8: TA = +25°C, f = 1 MHz, Capacitance is characterized but not tested.

Max

Units

Conditions

pF

VCC = 5.0V

pF

VCC = 5.0V, Switch OFF

Undershoot Characteristic (Note 9)

Symbol

Parameter

Min

Typ

Max

Units

Conditions

VOUTU

Output Voltage During Undershoot

2.5

VOH − 0.3

V

Figure 1

Note 9: This test is intended to characterize the device’s protective capabilities by maintaining output signal integrity during an input transient voltage

undershoot event.

FIGURE 1.

Device Test Conditions

Parameter

VIN

R1 = R2

VTRI

VCC

Value

see Waveform

100K

11.0

5.5

Units

V

Ω

V

V

Transient

Input Voltage (VIN) Waveform

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