HAL525, HAL535
3.4. Absolute Maximum Ratings
Symbol
VDD
−VP
−IDD
IDDZ
VO
IO
IOmax
IOZ
Parameter
Supply Voltage
Test Voltage for Supply
Reverse Supply Current
Supply Current through
Protection Device
Output Voltage
Continuous Output On Current
Peak Output On Current
Output Current through
Protection Device
Pin Name
1
1
1
1
3
3
3
3
Min.
−15
−242)
−
−2003)
−0.3
−
−
−2003)
Max.
281)
−
501)
2003)
281)
501)
2503)
2003)
TS
Storage Temperature Range
−65
150
TJ
Junction Temperature Range
−40
150
−40
1704)
1)
2)
as long as
with a 220
TJmax is
Ω series
not exceeded
resistance at pin
1
corresponding
to
the
test
circuit
(see
Fig.
5–1)
3) t <2 ms
4) t <1000 h
Unit
V
V
mA
mA
V
mA
mA
mA
°C
°C
Stresses beyond those listed in the “Absolute Maximum Ratings” may cause permanent damage to the device. This
is a stress rating only. Functional operation of the device at these or any other conditions beyond those indicated in
the “Recommended Operating Conditions/Characteristics” of this specification is not implied. Exposure to absolute
maximum ratings conditions for extended periods may affect device reliability.
3.5. Recommended Operating Conditions
Symbol
VDD
IO
VO
Parameter
Supply Voltage
Continuous Output On Current
Output Voltage
(output switched off)
Pin Name
1
3
3
Min.
3.8
0
0
Max.
Unit
24
V
20
mA
24
V
Micronas
7