7C261-20 데이터 시트보기 (PDF) - Cypress Semiconductor
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7C261-20 Datasheet PDF : 14 Pages
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CY7C261
CY7C263/CY7C264
Electrical Characteristics Over the Operating Range[3,4]
Parameter
Description
Test Conditions
VOH
Output HIGH Voltage
VOH
Output HIGH Voltage
VOL
Output LOW Voltage
VCC = Min., IOH = –2.0 mA
VCC = Min., IOH = –4.0 mA
VCC = Min., IOL = 8 mA
(6 mA Mil)
VOL
Output LOW Voltage
VCC = Min., IOL = 16 mA
VIH
Input HIGH Level
VIL
Input LOW Level
IIX
Input Current
GND < VIN < VCC
VCD
Input Diode Clamp Voltage
IOZ
Output Leakage Current
GND < VOUT < VCC
Output Disabled
Com’l
Mil
IOS
Output Short Circuit Current[5]
VCC = Max., VOUT = GND
ICC
Power Supply Current
VCC = Max., f = Max.
IOUT = 0 mA
Com’l
Mil
ISB
Standby Supply Current (7C261) VCC = Max.,
CS > VIH
Com’l
Mil
VPP
Programming Supply Voltage
IPP
Programming Supply Current
VIHP
Input HIGH Programming Voltage
VILP
Input LOW Programming Voltage
7C261-20, 25
7C263-20, 25
7C264-20, 25
Min. Max.
2.4
0.4
7C261-35, 45, 55
7C263-35, 45, 55
7C264-35, 45, 55
Min. Max. Unit
V
2.4
V
V
2.0
0.8
–10 +10
Note 4
–10 +10
–40 +40
–20 –90
120
140
40
40
12
13
50
4.75
0.4
0.4
V
2.0
V
0.8
V
–10
+10 µA
Note 4
–10
+10 µA
–40
+40 µA
–20
–90 mA
100 mA
120
30
mA
30
12
13
V
50
mA
4.75
V
0.4
V
Capacitance[4]
Parameter
CIN
COUT
Description
Input Capacitance
Output Capacitance
Test Conditions
TA = 25°C, f = 1 MHz,
VCC = 5.0V
Max.
Unit
10
pF
10
pF
Notes
3. See the last page of this specification for Group A subgroup testing information.
4. See the “Introduction to CMOS PROMs” section of the Cypress Data Book for general information on testing.
5. For test purposes, not more than one output at a time should be shorted. Short circuit test duration should not exceed 30 seconds.
Document #: 38-04010 Rev. *C
Page 3 of 14
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