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74ABT652ADB,118 Datasheet PDF : 19 Pages
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NXP Semiconductors
74ABT652A
Octal transceiver/register; non-inverting; 3-state
9. Static characteristics
Table 6. Static characteristics
Symbol Parameter
Conditions
25 °C
−40 °C to +85 °C Unit
Min Typ Max Min Max
VIK
input clamping voltage VCC = 4.5 V; IIK = −18 mA
−1.2 −0.9 - −1.2
-V
VOH
HIGH-level output
voltage
VI = VIL or VIH
VCC = 4.5 V; IOH = −3 mA
VCC = 5.0 V; IOH = −3 mA
VCC = 4.5 V; IOH = −32 mA
2.5 3.0 -
2.5
3.0 3.5 -
3.0
2.0 2.4 -
2.0
-V
-V
-V
VOL
VOL(pu)
LOW-level output voltage VCC = 4.5 V; IOL = 64 mA;
VI = VIL or VIH
power-up LOW-level
output voltage
VCC = 5.5 V; IO = 1 mA;
VI = GND or VCC
- 0.3 0.55 -
[1] - 0.13 0.55
-
0.55 V
0.55 V
II
input leakage current
VCC = 5.5 V; VI = GND or 5.5 V
control pins
- ±0.01 ±1.0 -
±1.0 µA
data pins
-
±5 ±100 -
±100 µA
IOFF
power-off leakage current VCC = 0 V; VI or VO ≤ 4.5 V
- ±5.0 ±100 -
IO(pu/pd) power-up/power-down VCC = 2.1 V; VO = 0.5 V;
[2] - ±5.0 ±50
-
output current
VI = GND or VCC; OEAB, OEBA
don’t care
±100 µA
±50 µA
IOZ
OFF-state output current VCC = 5.5 V; VI = VIL or VIH
VO = 2.7 V
- 5.0 50
-
50 µA
VO = 0.5 V
- −5.0 −50 -
−50 µA
ILO
output leakage current VCC = 5.5 V; HIGH-state;
VO = 5.5 V; VI = GND or VCC
- 5.0 50
-
50 µA
IO
output current
VCC = 5.5 V; VO = 2.5 V
[3][5] −180 −65 −40 −180
−40 mA
ICC
supply current
VCC = 5.5 V; VI = GND or VCC
outputs HIGH-state
- 110 250 -
250 µA
outputs LOW-state
-
20 30
-
30 mA
outputs disabled
- 110 250 -
250 µA
∆ICC
additional supply current per input pin; VCC = 5.5 V; one
[4] -
0.3 1.5
-
input at 3.4 V; other inputs at VCC
or GND
1.5 mA
CI
input capacitance
VI = 0 V or VCC
-
4
-
-
- pF
CO
output capacitance
outputs disabled; VO = 0 V
or VCC
-
7
-
-
- pF
[1] For valid test results, data must not be loaded into the flip-flops (or latches) after applying the power.
[2] This parameter is valid for any VCC between 0 V and 2.1 V with a transition time of up to 10 ms. For VCC = 2.1 V to VCC = 5 V ± 10 %, a
transition time of up to 100 µs is permitted.
[3] Not more than one output should be tested at a time, and the duration of the test should not exceed one second.
[4] This is the increase in supply current for each input at 3.4 V.
[5] This data sheet limit may vary among suppliers.
74ABT652A_2
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 02 — 12 March 2010
© NXP B.V. 2010. All rights reserved.
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