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MK50H27 데이터 시트보기 (PDF) - STMicroelectronics

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MK50H27
ST-Microelectronics
STMicroelectronics ST-Microelectronics
MK50H27 Datasheet PDF : 56 Pages
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MK50H27
4.4.8 MK50H27 Internal Self Test
The MK50H27 contains an easy to use internal self test designed to test, with a high fault coverage, all
of the major blocks of the device except the DMA controller. It is suggested that a loopback test also be
performed to more completely test the DMA controller.
The following procedure should be followed to execute the internal self test:
1. Reset the device using the RESET pin.
2. Set bit 04 of CSR4.
3. Issue a Self Test Request through CSR1.
4. Poll CSR1, waiting for the PAV bit in CSR1 to be set by the MK50H27.
5. After the PAV bit is set, read CSR1. The success or failure of the test is indicated in the PPRIM field
as follows:
PPRIM
00
17
18
19
20
21
22
Otherwise
RESULT
Passed self test.
Failed the reset test of the self test.
Failed the self test in the micro controller RAM.
Failed the self test in the ALU.
Failed the self test in the timers.
Failed the self test in the transmitter and/or receiver.
Failed the self test in the CSR’s and/or bus master.
Failed device.
6. If the PAV bit is not set within 75 msec (SYSCLK = 10MHZ), then the MK50H27 is unable to respond
to the Self Test Request and will not complete successfully.
If the self test passes, then it may be immediately reexecuted from step 3, otherwise re-execution
should proceed from step 1.
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