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SVSP0A225M 데이터 시트보기 (PDF) - NEC => Renesas Technology

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SVSP0A225M
NEC
NEC => Renesas Technology NEC
SVSP0A225M Datasheet PDF : 16 Pages
First Prev 11 12 13 14 15 16
SVS SERIES
GUIDE TO APPLICATIONS FOR TANTALUM CHIP CAPACITORS
The failure of the solid tantalum capacitor is mostly classified into a short-circuiting mode and a large leakage
current mode. Refer to the following for reliable circuit design.
1. Expecting Reliability
SVS series tantalum chip capacitors are typically applied to decoupling, blocking, bypassing and filtering.
The SVS series has a very high reliability (low failure rate) in the field. For example, the maximum field failure
rate of an SVS series capacitor with a DC rated voltage of 16 V is 0.0004% / 1000 hour (4 Fit) at an applied voltage
of 5 V, operating temperature of 25˚C and series resistance of 3 .
The maximum failure rate in the field is estimated by the following expression :
λ = λ0
3
V
T-T0
× 2 10
V0
λ : Maximum field failure rate
λ0 : 1% /1000 hour (The failure rate of the SVS series at the full DC rated voltage at operating
temperature of 85˚C and series resistance of 3 .)
V : Applied voltage in actual use
V0 : DC Rated voltage
T : Operating temperature in actual use
T0 : 85˚C
The nomograph is provided for quick estimation of
120
maximum field failure rates.
102
7
110
4
Connect operating temperature T and applied
voltage ratio V/ V0 of interest with a straight line.
2
The failure rate multiplier F is given at the inter-
101
section of this line with the model scale. The failure
100
7
rate is obtained as λ = λ 0 F.
4
90
2
1.0
Examples :
100
7
4
0.9
Given V/ V0 = 0.4 and T = 45˚C. read
0.8
F = 4 × 10 –3
0.7
Hence, λ = 0.004%/1000 hour (40 Fit).
80
2
10–1
7
0.6
Given V/ V0 = 0.3 and T = 25˚C, read
F = 4 × 10 –4
0.5
Hence, λ = 0.0004%/1000 hour (4 Fit).
70
4
2
0.4
10–2
60
7
4
0.3
2
50
10–3
7
0.2
4
40
2
10–4
7
30
4
2
0.1
10–5
20
11

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