HS-82C37ARH(1995) 데이터 시트보기 (PDF) - Intersil
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HS-82C37ARH Datasheet PDF : 29 Pages
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HS-82C37ARH
Intersil Space Level Product Flow -8
GAMMA Radiation Verification (Each Wafer) Method 1019,
2 Samples/Wafer, 0 Rejects
100% Dynamic Burn-In, Condition D, 160 Hours, +125oC or
Equivalent, Method 1015
100% Die Attach
100% Interim Electrical Test
Periodic- Wire Bond Pull Monitor, Method 2011
100% PDA, Method 5004 (Note 1)
Periodic- Die Shear Monitor, Method 2019 or 2027
100% Final Electrical Test
100% Internal Visual Inspection, Method 2010, Condition B 100% Fine/Gross Leak, Method 1014
CSI an/or GSI PreCap (Note 5)
100% External Visual, Method 2009
100% Temperature Cycle, Method 1010, Condition C,
10 Cycles
100% Constant Acceleration, Method 2001, Condition per
Method 5004
100% External Visual
100% Initial Electrical Test
Sample - Group A, Method 5005 (Note 2)
Sample - Group B, Method 5005 (Note 3)
Sample - Group C, Method 5005 (Notes 3 and 4)
Sample - Group D, Method 5005 (Notes 3 and 4)
100% Data Package Generation (Note 6)
CSI and/or GSI Final (Note 5)
NOTES:
1. Failures from subgroup 1, 7 are used for calculating PDA. The maximum allowable PDA = 5%.
2. Alternate Group A testing may be performed as allowed by MIL-STD-883, Method 5005.
3. Group B, C and D inspections are optional and will not be performed unless required by the P.O. When required, the P.O. should include
separate line items for Group B Test, Group C Test, Group C Samples, Group D Test and Group D Samples.
4. Group C and/or Group D Generic Data, as defined by MIL-I-38535, is optional and will not be supplied unless required by the P.O. When
required, the P.O. should include a separate line item for Group C Generic Data and/or Group D Generic Data. Generic data is not guar-
anteed to be available and is therefore not available in all cases.
5. CSI and/or GSI inspections are optional and will not be performed unless required by theP.O. When required, the P.O. should include
separate line items for CSI PreCap inspection, CSI final inspection, GSI PreCap inspection, and/or GSI final inspection.
6. Data Package Contents:
• Cover Sheet (Intersil Name and/or Logo, P.O. Number, Customer Part Number, Lot Date Code, Intersil Part Number, Lot Number, Quan-
tity).
• GAMMA Radiation Report. Contains Cover page, disposition, Rad Dose, Lot Number, Test Package used, Specification Numbers, Test
equipment, etc. Radiation Read and Record data on file at Intersil.
• Screening, Electrical, and Group A attributes (Screening attributes begin after package seal).
• Group B, C and D attributes and/or Generic data is included when required by the P.O.
• The Certificate of Conformance is a part of the shipping invoice and is not part of the Data Book. The Certificate of Conformance is signed
by an authorized Quality Representative.
AC Test Circuit
OUTPUT FROM
DEVICE UNDER TEST
V1
R1
TEST POINT
C1*
*Includes Stray and Jig Capacitance
AC Testing Input, Output Waveforms
VDD -1.5V
INPUT
VIL -0.4V
1.5V
VOH
OUTPUT
VOL
OUTPUT
Z
L OR H
2.0V
0.8V
VOH
VOL
VOH
L OR H
Z
VOH - 0.45V
0.45
TEST CONDITION DEFINITION TABLE
PINS
V1
R1
C1
All Output Except EOP
1.7V
510Ω
100pF
EOP
VDD
1.6KΩ
50pF
Spec Number 518058
928
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