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FOD2711A

Optically Isolated Error Amplifier

Fairchild Semiconductor 

Electrical Characteristics (Continued) (TA = 25°C unless otherwise specified)

Isolation Characteristics

Symbol

Parameter

Test Conditions

Min.

II-O

VISO

RI-O

Input-Output Insulation

Leakage Current

Withstand Insulation

Voltage

Resistance (Input to Output)

RH = 45%, TA = 25°C, t = 5s,

VI-O = 3000 VDC(6)

RH ≤ 50%, TA = 25°C, t = 1 min.(6)

VI-O = 500 VDC(6)

5000

Typ.

1012

Max.

1.0

Unit

µA

Vrms

Ω

Switching Characteristics

Symbol

Parameter

BW

CMH

CML

Bandwidth

Common Mode Transient

Immunity at Output HIGH

Common Mode Transient

Immunity at Output LOW

Test Conditions

(Fig. 7)

ILED = 0mA, Vcm = 10 VPP,

RL = 2.2kΩ(7) (Fig. 8)

ILED = 1mA, Vcm = 10 VPP,

RL = 2.2kΩ(7) (Fig. 8)

Min.

Typ.

10

1.0

Max.

Unit

kHZ

kV/µs

1.0

kV/µs

Notes:

6. Device is considered as a two terminal device: Pins 1, 2, 3 and 4 are shorted together and Pins 5, 6, 7 and 8 are shorted

together.

7. Common mode transient immunity at output high is the maximum tolerable (positive) dVcm/dt on the leading edge

of the common mode impulse signal, Vcm, to assure that the output will remain high. Common mode transient

immunity at output low is the maximum tolerable (negative) dVcm/dt on the trailing edge of the common pulse

signal,Vcm, to assure that the output will remain low.

©2003 Fairchild Semiconductor Corporation

FOD2711 Rev. 1.0.1

5

www.fairchildsemi.com

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