HN27C256AG 데이터 시트보기 (PDF) - Hitachi -> Renesas Electronics

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HN27C256AG

32768-word × 8-bit UV Erasable and Programmable ROM

Hitachi -> Renesas Electronics 

HN27C256AG Series

AC Characteristics (Ta = 0 to +70°C, VCC = 5 V ± 10%, VPP = VCC)

Test Conditions

• Input pulse levels: 0.45 V to 2.4 V

• Input rise and fall time: ≤ 10 ns

• Output load: 1TTL gate + 100 pF

• Reference levels for measuring timing: Inputs; 0.8 V and 2.0 V

Outputs; 0.8 V and 2.0 V

HN27C256AG

-10

-12

-15

Parameter

Symbol Min Max Min Max Min Max Unit Test Conditions

Address to output delay tACC

—

100 —

120 —

150 ns

CE = OE = VIL

CE to output delay

t CE

—

100 —

120 —

150 ns

OE = VIL

OE to output delay

t OE

—

60

—

60

—

70

ns

CE = VIL

OE high to output float tDF

0

35 0

40 0

50

ns

CE = VIL

Address to output hold tOH

5

—5

—5

—

ns

CE = OE = VIL

Note: tDF is defined as the time at which the output achieves the open circuit condition and data is no longer

driven.

Read Timing Waveform

Address

CE

Standby Mode

OE

Data Out

Active Mode

tCE

Standby Mode

tOE

tACC

tDF

tOH

Data Out Valid

6

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