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전자부품 반도체 검색엔진( 무료 PDF 다운로드 ) - 데이터시트뱅크

ISB35389 데이터 시트보기 (PDF) - STMicroelectronics

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ISB35389
ST-Microelectronics
STMicroelectronics ST-Microelectronics
ISB35389 Datasheet PDF : 15 Pages
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ISB35000 SERIES
EVALUATION DEVICE
An evaluation device is used to demonstrate the
performance of the ISB35000 series as well as
verify the effectiveness of the design system. The
device has path delays, latches, a host of macro-
cells and embedded functions which were used to
verify the simulated characteristics that are supplied
in the data book. Characterization of the path delays
including interconnect shows typical delays of 210
ps for a 2 input NAND with receivers/drivers oper-
ating at frequencies of 200 MHz. The evaluation
device is available in a 208 pin plastic quad flat pack.
Figure 5. Evaluation Device
9/15

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